Influence of the deposition process and substrate on microstructure, phase composition, and residual stress state on as-deposited Cr-Al-C coatings

In situ characterization of stresses, deformation and fracture of thin films using transmission X-ray nanodiffraction microscopy

“…The measurement of full Debye-Scherrer rings then allows texture to be measured (or at least estimated) from the azimuthal intensity distributions, and residual stresses to be determined from the distortion of the rings. This approach has since been used to measure important characteristics, including residual stress distribution, in a multitude of different coating systems such as TiN (Daniel et al, 2014;Meindlhumer et al, 2020a), (Ti,Al)N (Riedl et al, 2014;Zalesak et al, 2016a,b;Ba ¨cke et al, 2023), TiAlON (Schalk et al, 2019), CrN (Daniel et al, 2013;Bartosik et al, 2013;Daniel et al, 2015), Cr-Al-C (Heinze et al, 2023), TiW (Saghaeian et al, 2019), TiB (Schalk et al, 2014), Al 2 O 3 (Tkadletz et al, 2015), diamond (Gruber et al, 2019;Hinzmann et al, 2021) and different multilayers (Bartosik et al, 2015;Keckes et al, 2018;Tkadletz et al, 2018;Ja ¨ger et al, 2019;Klima et al, 2019).…”