Influence of void on image quality of industrial SPECT

Abstract

Industrial single photon emission computed tomography (SPECT) is a promising technique to determine the dynamic behavior of industrial process media and has been developed in the Korea Atomic Energy Research Institute. The present study evaluated the influence of a void, which is presence in multiphase reactors of industrial process, on the image quality of an industrial SPECT. The results are very encouraging; that is, the performance of the industrial SPECT system is little influenced by the presence of a void, which means that industrial SPECT is an appropriate tool to estimate the dynamic characteristics of the process media in a water-air phase bubble column with a static gas sparger.

Photonic Material Selection of Scintillation Crystals Using Monte Carlo Method for X-Ray Detection in Industrial Computed Tomography

“…The interaction patterns between Xray photons and scintillation crystals are random, but the occurrence probability depends on interaction cross section. Generally, the scintillation crystal used in array detector of industrial X-CT system adopts cylinder design [27,28]. In our Monte Carlo simulation study, we assume that the energy of X-ray source is monochromatic and adjustable, the X-ray beam is a parallel beam after X-ray passes through the front collimator, the diameter of scintillation crystal is 0.3 cm, and the length of cylinder could be changed, as shown in Figure 2.…”

Optimization of detection geometry for industrial SPECT by Monte Carlo simulations

“…The radioisotopes of 99m Tc (140 keV), 68 Ga (511 keV), and 137 Cs (662 keV) were placed at the center of the column in the simulations as a point source. The radiation detection system was assumed to use an energy window which was set to be ±10% of γ-ray energy released from the sources to discriminate scattered radiation [6]. In the simulation, the energy resolution of the detectors was assumed to be 22%, 11%, and 10% at 140 keV, 511 keV, and 662 keV, respectively, following the energy resolution of our detectors.…”