Influences of deposition parameters on micro-crystalline silicon single junction cell efficiency in large-area and high rate deposition

Hwang, Doo Sup; Lee, Cheong Hoon; Lee, Jun Oh; Jeon, Chang Yeop; Lim, You Bong; Chang, Cheol Jong; Chang, Woo Sok

doi:10.1007/s12541-012-0146-8

Cited by 3 publications

(1 citation statement)

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“…From among the many types of solar cells as the promising alternatives to fossil fuel, [1][2][3][4][5] crystalline silicon solar cells were forecasted to hold their dominance for the next few decades. To further increase the cell efficiency of a crystalline silicon solar cell, the achievement of obtaining low contact resistivity between silver electrodes and the emitter layer of a crystalline silicon solar cell has been a primary issue for the developers of silver paste and various approaches have been attempted, such as glass frit chemistry, [6][7][8][9] and the formation of nickel silicide using nickel particles or a nickel layer.…”

Section: Introductionmentioning

confidence: 99%

Uncertainty analysis in contact resistivity measurements of crystalline silicon solar cells

Shin

Yoo

Seo

2015

Int. J. of Precis. Eng. and Manuf.-Green Tech.

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The achievement of obtaining low contact resistivity between silver electrodes and the emitter layer of a crystalline silicon solar cell has been a constant issue for the silver paste developers in crystalline silicon solar cell industries. However, it has been found that there are factors that significantly distort the accurate characterization of contact resistivity. One group of such factors have been identified to be not related with the physical traits of silver paste nor the size of a crystalline silicon solar cell wafer. These factors include mathematical formulations to calculate contact resistivity, the preparation method for specimens, probing methods, current source settings, and environmental conditions. On the other hand, the other group of such factors are directly related with the formulation method and composition of silver paste, and the size of a crystalline silicon solar cell wafer where specimens for the resistance measurements are prepared. Through this study, the impact of each factor on resistance measurement using a three-point probe method for the calculation of contact resistivity is analyzed.

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