Influences of nitrogen flow rate on the structures and properties of Ti and N co-doped diamond-like carbon films deposited by arc ion plating

Nitrogen-doped diamond-like carbon (DLC:N) films prepared by the filtered cathodic vacuum arc technology are functionalized with various chemical molecules including dopamine (DA), 3-Aminobenzeneboronic acid (APBA), and adenosine triphosphate (ATP), and the impacts of surface functionalities on the surface morphologies, compositions, microstructures, and cell compatibility of the DLC:N films are systematically investigated. We demonstrate that the surface groups of DLC:N have a significant effect on the surface and structural properties of the film. The activity of PC12 cells depends on the particular type of surface functional groups of DLC:N films regardless of surface roughness and wettability. Our research offers a novel way for designing functionalized carbon films as tailorable substrates for biosensors and biomedical engineering applications.

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Structural characteristics of surface-functionalized nitrogen-doped diamond-like carbon films and effective adjustment to cell attachment

Liu

Qian

et al. 2015

“…Diamond-like carbon (DLC) film has been widely investigated [1][2][3][4][5][6] because of its high mechanical hardness, high electrical resistivity, and excellent optical transparency over a wide range. The film is comprised of a mixture of sp 3 and sp 2 hybridized carbon bondings.…”

Section: Introductionmentioning

confidence: 99%

Effects of the ion-beam voltage on the properties of the diamond-like carbon thin film prepared by ion-beam sputtering deposition

Sun¹,

Hu²,

Zhang³

et al. 2015

Diamond-like carbon (DLC) thin film is one of the most widely used optical thin films. The fraction of chemical bondings has a great influence on the properties of the DLC film. In this work, DLC thin films are prepared by ion-beam sputtering deposition in Ar and CH4 mixtures with graphite as the target. The influences of the ion-beam voltage on the surface morphology, chemical structure, mechanical and infrared optical properties of the DLC films are investigated by atomic force microscopy (AFM), Raman spectroscopy, nanoindentation, and Fourier transform infrared (FTIR) spectroscopy, respectively. The results show that the surface of the film is uniform and smooth. The film contains sp2 and sp3 hybridized carbon bondings. The film prepared by lower ion beam voltage has a higher sp3 bonding content. It is found that the hardness of DLC films increases with reducing ion-beam voltage, which can be attributed to an increase in the fraction of sp3 carbon bondings in the DLC film. The optical constants can be obtained by the whole infrared optical spectrum fitting with the transmittance spectrum. The refractive index increases with the decrease of the ion-beam voltage, while the extinction coefficient decreases.

“…[7][8][9][10][11][12] With the miniaturization of conductors, especially nano-size and meso-size conductors, the study of anisotropic properties is very important due to the geometric characteristics of nanowires and nanotubes. [13][14][15][16][17][18] From the technological viewpoint, electromigration is a major failure in the operation of solid state electronic devices. From the theoretical viewpoint, electromigration involves microscopic electric fields and subtle dynamical processes occurring in coupled electron and atom transportation.…”

Section: Introductionmentioning

confidence: 99%

Effects of energy dissipation on anisotropic materials

Zhang¹

2015

A model and its simulations are presented to describe the effects of energy dissipation on anisotropic systems. When the current electromigration is constant, energy dissipation depends on lattice constants, resistivity, and the angles along the longitudinal and transversal directions. It is shown that an orientation variation of the grain can significantly influence the energy dissipation for some anisotropic materials. Based on calculations for the grain model, the mechanism of grain growth and microstructure evolution under electromigration is explained. Theoretical implications about material selection and reliability are derived.