Information extraction from Murphy–Good plots of tungsten field electron emitters

Abstract

This study introduces an easy methodology to test and analyze experimental field electron emission current-voltage data from metallic single-tip emitters; this novel and easy methodology is called the Murphy–Good plots. Tungsten electron emitters were used as an example and were prepared by the electrochemical etching process. The current-voltage characteristics are obtained in high vacuum levels and using a traditional field emission microscope. Murphy–Good plots are used to apply the well-known field electron emission orthodoxy test to the experimental data and then to extract the emitters’ characterization parameters if the test is passed. The novelty in using this type of plots lies in its independency on any correction factors, unlike the traditional Fowler–Nordheim and Millikan–Lauritsen plots, in addition to its simple theoretical form. The results are calculated using a simple web tool that applies the field electron emission orthodoxy test to any type of the current-voltage analysis plots and then to extract the characterization parameters of the emitters.

Interpretation of field emission current-voltage data: background theory and detailed simulation testing of a user-friendly webtool

“…As specific examples within the context of electron sources, the webtool has been used to to analyze results from tungsten needle-like emitters [45] and from LAFEs of polymer graphite flakes [46]. We plan that the webtool should be a first step in a larger project that aims to monitor and control the behaviour of electron sources during operation, not only in FE experiments, but also in related scientific and industrial instruments, for example field emission scanning electron microscopes.…”

Comprehensive Analysis of E478 Single-Component Epoxy Resin and Tungsten-E478 Interface for Metallic-Polymer Composite Electron Source Applications

“…The cathode is prepared as a micro/nano single tip field emitter (STFE) or an array of STFEs known as large area field emitters (LAFE). The applied electrostatic field reduces the potential energy barrier at the surface of the cathode apex, which allows cold electrons (electrons with low energy at the Fermi level) to quantum mechanically tunnel through to form an electron beam. , …”

“…The applied electrostatic field reduces the potential energy barrier at the surface of the cathode apex, which allows cold electrons (electrons with low energy at the Fermi level) to quantum mechanically tunnel through to form an electron beam. 16 , 17 …”