2009
DOI: 10.1016/j.jallcom.2008.10.053
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Infrared emission imaging as a tool for characterization of hydrogen storage materials

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Cited by 20 publications
(23 citation statements)
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“…In a subsequent study, IR emissivity mapping was used in tandem with TEM to study hydrogenation in Mg-Ni libraries. 319 They found that over a broad range of Ni concentrations, a Ni stabilized fcc Mg phase coexisted with precipitates of Mg 2 Ni and MgNi 2 , which resulted in an increased hydrogenation pressure. It was further demonstrated that this technique could be used to monitor metal to semiconductor, as well as metal to metal transformations; this finding is important since many hydrogen storage materials can exhibit multiple decomposition steps, and not all of the products are insulating.…”
Section: Thin Film Combinatorial Workmentioning
confidence: 99%
“…In a subsequent study, IR emissivity mapping was used in tandem with TEM to study hydrogenation in Mg-Ni libraries. 319 They found that over a broad range of Ni concentrations, a Ni stabilized fcc Mg phase coexisted with precipitates of Mg 2 Ni and MgNi 2 , which resulted in an increased hydrogenation pressure. It was further demonstrated that this technique could be used to monitor metal to semiconductor, as well as metal to metal transformations; this finding is important since many hydrogen storage materials can exhibit multiple decomposition steps, and not all of the products are insulating.…”
Section: Thin Film Combinatorial Workmentioning
confidence: 99%
“…These figures provide an estimation of the pressures and the rates at which hydrogen is absorbed/desorbed as a function of composition and temperature. One can see, for instance, that as the Ni content is increased to x ≈ 0.3, the pressure required for the initial hydrogenation of the films increases from less than 1 bar to greater than 3 bars, and the film begins to release hydrogen at lower temperatures, possibly indicating the formation of the complex hydride Mg 2 NiH 4 [9].…”
Section: Nire Measurements Of Composition-spread Samplesmentioning
confidence: 99%
“…In the thin-film community, where quantitative measurements of the hydrogen content in combinatorial samples are not possible, most work has focused on the physical vapor deposition of composition-spread samples and primary screening of the thermodynamics and kinetics of hydrogen storage properties through measurements of secondary properties associated with hydrogenation. Rapid screening measurements for thin films have been demonstrated including measurements of film transparency, the stress of MEMS bimorphs, normalized IR emissivity (NIRE) and ex situ XRD studies [7][8][9][10].…”
Section: Introductionmentioning
confidence: 99%
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“…The XRD patterns of the as-deposited MgNi films show an amorphous structure. Recent TEM studies of the ''X-ray amorphous'' films show that they consist of nanoscale grains of a metastable fcc phase [5].…”
Section: Experimental Techniquementioning
confidence: 99%