2022
DOI: 10.3390/mi13050812
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Infrared Transmission Characteristics of Phase Transitioning VO2 on Various Substrates

Abstract: Infrared transmission characteristics of VO2 thin films synthesized on multiple substrates, using a low-pressure direct oxidation technique, have been characterized. Material characterization of these films indicates high material quality, which resulted in large variation of electrical and optical properties at phase transition. A change in optical transmissivity greater than 80% was observed for these films utilizing infrared (IR) laser illumination at 1550 nm. Phase transition enabled by temperature change … Show more

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Cited by 4 publications
(5 citation statements)
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“…Prior to the deposition of Ti/Au metal fingers on the circular VO 2 thin films, they were investigated though multiple characterization methods. AFM images of the VO 2 thin films were captured (using a Veeco Dimension 3100 instrument) and the RMS roughness of the VO 2 film surface were determined as a measure of surface quality. , Structural characterization was performed through X-ray diffraction (XRD) using a Rigaku Ultima IV system (Cu Kα radiation, wavelength 15.406 nm), which provided information on their crystalline quality. According to the National Bureau of Standards, Silicon has been selected as the Standard Reference Materials (SRM-640) …”
Section: Experimental Methodsmentioning
confidence: 99%
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“…Prior to the deposition of Ti/Au metal fingers on the circular VO 2 thin films, they were investigated though multiple characterization methods. AFM images of the VO 2 thin films were captured (using a Veeco Dimension 3100 instrument) and the RMS roughness of the VO 2 film surface were determined as a measure of surface quality. , Structural characterization was performed through X-ray diffraction (XRD) using a Rigaku Ultima IV system (Cu Kα radiation, wavelength 15.406 nm), which provided information on their crystalline quality. According to the National Bureau of Standards, Silicon has been selected as the Standard Reference Materials (SRM-640) …”
Section: Experimental Methodsmentioning
confidence: 99%
“…In previous work, we demonstrated near-IR modulation using the VO 2 film on the GaN substrate for 790 and 1550 nm IR beam, which resulted in optical modulation of 7 and 14%, respectively, for up to 300 μs pulses. However, the IR modulation was demonstrated with the application of external heating to the VO 2 film to vary the temperature of the film and initiate phase transition and significant optical modulation. , In order to trigger the semiconductor-to-metal transition (SMT) with electric field only, past reports mentioned large voltage requirements to cause a noticeable transition. , In this work, we have synthesized a good quality VO 2 film on a small circular area of the GaN substrate and the oxidized silicon-on-insulator (SOI) substrate, using a modified synthesis method, , and have used interdigitated metal finger patterns on the VO 2 film layers to apply required electric field. The film quality and device geometry resulted in a fast phase transition via localized heating of the membrane, allowing for more than 50% intensity modulation at 2600 nm IR wavelength with frequencies exceeding 10 kHz.…”
Section: Introductionmentioning
confidence: 99%
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