2019
DOI: 10.1088/2053-1591/ab4925
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InGaAs/graphene infrared photodetectors with enhanced responsivity

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Cited by 34 publications
(16 citation statements)
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“…Even so, the value of D* could reach up to 410 11 cm Hz 1/2 W À1 under all gate voltages. To benchmark our device, we compared graphene-based high-performance hybrid phototransistors using various strategies, including charge-transfer assistance, 8,10,28,[37][38][39][40][41] substrate engineering, [42][43][44] tunneling assistance, [45][46][47] a vertical structure, 48,49 and contact engineering, 5,50,51 as summarized in Fig. 5d.…”
Section: Resultsmentioning
confidence: 99%
“…Even so, the value of D* could reach up to 410 11 cm Hz 1/2 W À1 under all gate voltages. To benchmark our device, we compared graphene-based high-performance hybrid phototransistors using various strategies, including charge-transfer assistance, 8,10,28,[37][38][39][40][41] substrate engineering, [42][43][44] tunneling assistance, [45][46][47] a vertical structure, 48,49 and contact engineering, 5,50,51 as summarized in Fig. 5d.…”
Section: Resultsmentioning
confidence: 99%
“…Recently, Yang et al developed the graphene/InGaAs hybrid photodetector. [ 130 ] They found that the photoresponsivity of graphene/InGaAs photodetector can be increased by 14.7 times (7.66 A W −1 ) than the pure InGaAs photodetector along with response time 2 times faster in 1550 nm at ambient conditions. Table 6 gives a summary of some of the graphene photodetectors with their performances.…”
Section: Applications Of Graphenementioning
confidence: 99%
“…On the other hand, for Si-based OEIC, the Si-based light source is the ultimate obstacle to achieve owing to the fact that Si is an indirect band-gap semiconductor material, and its emission efficiency is very low, which makes it unavailable as the active gain medium for Si-based high-efficient light sources. In contrast, most group III-V materials are definitely suitable for the optoelectronic devices in light-emitting/absorbing devices, including light-emitting diodes (LEDs), lasers, and detectors [ 11 , 12 , 13 , 14 ], owing to their direct bandgap properties, indicating their stronger photon emission and absorption efficiency in comparison than indirect semiconductors such as Si, Ge [ 15 , 16 ], and GeSn [ 17 ]. Thus, taking advantage of the excellent properties of III-V compounds, Si-based III-V CMOS devices and III-V photoelectric devices can further greatly improve the data transmission speed and amount, which effectively reduce integrated electricity and power consumption [ 18 ].…”
Section: Introductionmentioning
confidence: 99%