2013
DOI: 10.1116/1.4810789
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InGaN light-emitting diodes: Efficiency-limiting processes at high injection

Abstract: The authors discuss a relatively comprehensive theoretical and experimental study aimed on unveiling the dominant efficiency loss mechanism at high injection levels in InGaN light-emitting diodes(LEDs), which still limits their application for general lighting despite the breathtaking performance demonstration. A large body of theoretical and experimental data ascribes the observed efficiency loss to overflow of hot electrons aggravated by nonuniform distribution of carriers in the active region as the primary… Show more

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Cited by 41 publications
(37 citation statements)
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“…Carrier overshoot [11], i.e., non-capture of the electrons injected from the n-side, is avoided by the use of multiple quantum wells (QWs), where electrons overshooting one QW are captured by the next ones. Electron leakage into the p-GaN layer surrounding the lightemitting QWs is avoided by using wider bandgap (AlGaN) electron blocking layers.…”
Section: Injection Efficiencymentioning
confidence: 99%
“…Carrier overshoot [11], i.e., non-capture of the electrons injected from the n-side, is avoided by the use of multiple quantum wells (QWs), where electrons overshooting one QW are captured by the next ones. Electron leakage into the p-GaN layer surrounding the lightemitting QWs is avoided by using wider bandgap (AlGaN) electron blocking layers.…”
Section: Injection Efficiencymentioning
confidence: 99%
“…More importantly, Li et al, by the electron holography, also measure and show a reduced electrostatic potential for the LED device with the InGaN insertion layer . However, a most recent physical model has been developed by Ni et al , Zhang et al , Li et al , Avrutin et al , Zhang et al , and Chang et al that a reduced electron leakage is caused by the phonon‐electron scattering taking place in the InGaN insertion layer. During the phonon‐scattering process, the electrons lose the energy of 92 meV, such that electrons become “cold” and the InGaN insertion layer functions as the “electron cooler (EC).” In addition, the study by Zhang et al further reveals the impact of the polarization‐induced electric field in the [0001]‐oriented InGaN EC layer on the electron energy .…”
Section: Approaches For Improving the Internal Quantum Efficiencymentioning
confidence: 99%
“…To counteract the polarization effect on EBL, several approaches have been suggested for blue LEDs, such as gradual or tapered EBL [4], [5], polarization-matched AlInGaN EBL [1], [6], and polarizationreversed electron-blocking structure [7], [8], etc. Besides, some strategies aimed to decelerate electron-transport or accelerate hole-transport in the active region, such as asymmetric multiquantum wells [9], and stair-case electron injector [10], [11], etc. Similar concepts could also be used for AlGaN DUV LEDs but require further study or optimization.…”
Section: Introductionmentioning
confidence: 99%