2020
DOI: 10.1021/acs.chemmater.9b04647
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Inherently Selective Atomic Layer Deposition and Applications

Abstract: The chemical approaches enabling selective atomic layer deposition (ALD) are gaining growing interest. The selective ALD has unlocked attractive avenues for the development of novel nanostructures and found its versatile applications in emerging fields beyond the semiconductor industry. In this article, the recent developments of inherently selective ALD methods are summarized. Based on precursors’ preferential adsorptions on dangling bonds, interstitials, grain boundaries, etc., single atom deposition, well a… Show more

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Cited by 92 publications
(83 citation statements)
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“…The deposition selectivity during such ALD processes originates from the quick material growth on a specific site or surface, while there is a nucleation delay before growth initiation on other, less desired sites or surfaces [33]. In inherently selective ALD, this is established by an appropriate combination of precursor, co-reactant, substrate material, precursor partial pressure and deposition temperature [307]. Alternatively, the deposition can be preceded by a surface preparation treatment prior to the ALD process to selectively functionalize the sample.…”
Section: Area-selective Ald For Next-level Catalyst Designmentioning
confidence: 99%
“…The deposition selectivity during such ALD processes originates from the quick material growth on a specific site or surface, while there is a nucleation delay before growth initiation on other, less desired sites or surfaces [33]. In inherently selective ALD, this is established by an appropriate combination of precursor, co-reactant, substrate material, precursor partial pressure and deposition temperature [307]. Alternatively, the deposition can be preceded by a surface preparation treatment prior to the ALD process to selectively functionalize the sample.…”
Section: Area-selective Ald For Next-level Catalyst Designmentioning
confidence: 99%
“…[60] ; (b) 分别在经过硫钝化(左)和经过 NH 4 OH刻蚀(右)处理的InAs基底上ALD沉积Al 2 O 3 前后对应的As 2p 3/2 XPS谱 [61] (网络版彩图) 图 7 在SiO 2 /Si基底上吸附ALD前驱体MeCpMn(CO) 3 后的 Mn 2p和Si 2p XPS谱 [47] (网络版彩图) 物 [48,70] , 或在氧化物上沉积金属等 [71] . 值得注意的是, 基底抑制生长模式是实现选择性ALD沉积的重要基 础, 它对于新兴的自下而上自对准微纳制造技术非常 重要 [72,73] . .…”
Section: 尽管这已不属于传统意义上的薄膜沉积 但是岛状生unclassified
“…The above methods achieve high selectivity for nano-feature patterning but have limitations in long passivation time and complex steps. Thus, inherently selective deposition has been investigated to relax process complexity [18]. Up to now, four types of ASD have been reported, including DoD, DoM, MoD and MoM (M = metal, D = dielectric).…”
Section: Introductionmentioning
confidence: 99%