Inheritance And Allelic Relationship Of Resistance Genes To Spot Blotch Of Wheat Caused By Bipolaris Sorokiniana

Kumar, Sundeep; Prasad, L. C.; Kumar, Uttam; Tyagi, K.; Arun, Banu K.; Joshi, Arun Kumar

doi:10.1007/1-4020-5497-1_15

Cited by 13 publications

(12 citation statements)

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“…Four different parameters, viz. chlorophyll fluorescence (F v /F m ) (Krause and Weis 1991), chlorophyll content (Chl) (Nikolaeva et al 2010;Pradhan et al 2012a), leaf temperature (Lt) (Blum et al 1989), and grain yield (Gyp) reduction under drought (Kumar et al 2007) were used as measures of drought tolerance. The quantum efficiency of PS II, F v /F m , plays a vital role in photosynthesis, and can be used as screening tool for drought tolerance (Blum and Ebercon 1981;Prasad et al 2007).…”

Section: Discussionmentioning

confidence: 99%

Genomic characterization of drought tolerance-related traits in spring wheat

et al. 2012

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Section: Discussionmentioning

confidence: 99%

Genomic characterization of drought tolerance-related traits in spring wheat

et al. 2012

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“…(2004a) reported that up to three additive genes controlled spot blotch resistance, without any dominance. Kumar et al. (2007) reported the presence of two genes in Longmai‐10 and Shanghai‐4, without any dominance.…”

Section: Introductionmentioning

confidence: 99%

“…Joshi et al (2004a) reported that up to three additive genes controlled spot blotch resistance, without any dominance. Kumar et al (2007) reported the presence of two genes in Longmai-10 and Shanghai-4, without any dominance. It is possible that if one starts scoring adult plants only at later stages, for example ZadoksÕ growth stage 75, one may find mostly susceptible plants because of high temperature effects.…”

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confidence: 99%

Genetic Improvement and Crop Management Strategies to Minimize Yield Losses in Warm Non‐traditional Wheat Growing Areas due to Spot Blotch Pathogen Cochliobolus sativus

Duveiller

Sharma²

2009

Journal of Phytopathology

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Spot blotch caused by Cochliobolus sativus emerged as a major threat to wheat production in the warmer nontraditional wheat growing areas in the late 1980s. This foliar disease causes significant yield losses annually (15-20% on average in South Asia) endangering the livelihoods of millions of small farmers. Effective measures in the field are needed to mitigate the impact of spot blotch on food security in affected areas. This review summarizes the global knowledge on genetic improvement and crop management strategies to minimize yield losses based on latest field research. Recent studies have shown that spot blotch severity is highly influenced by stress factors affecting crop physiology which in turn affects host tolerance and resistance to the pathogen. Soil nutrient and water stress aggravate spot blotch-induced grain yield losses. Heat stress which is gradually increasing in Asia causes higher levels of disease damage. Genetic improvement is the cornerstone of a sustainable control of spot blotch in all affected regions. Resistance is essentially based on Chinese and South American sources and inter-specific crosses with broadly adapted semi-dwarf germplasm. A list of genotypes consistently reported in the last 10 years to harbor at least partial resistance to spot blotch, along with their inheritance of resistance, has been compiled to help breeding programmes. As the fungus is aggressive under conditions of high relative humidity and heat which in turn influences plant susceptibility, a synthesis of the different tools for scoring disease severity is given. Because resistance is incomplete, the ultimate goal is the accumulation of minor genes of resistance in adapted high yielding genotypes. This paper shows how the use of resistant varieties, timely seeding, adequate fertilization, crop rotation, and the judicious use of fungicides can be part of an integrated management strategy for controlling yield losses due to spot blotch.

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“…Spot blotch resistance is governed by the presence of at least two or more genes or QTLs (Kumar et al 2007;Kumar et al 2009;Kumar et al 2010). Low level of resistance to spot blotch has been reported in most of the high yielding varieties of wheat in India (Joshi et al 2007a).…”

Section: Evaluation Of Wheat Germplasm At Hot Spot Locationsmentioning

confidence: 99%

Identification of new donors for spot blotch resistance in cultivated wheat germplasm

Kumari

Kumar

Singh

et al. 2018

Cereal Research Communications

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One thousand four hundred and eighty three spring wheat germplasm (Triticum aestivum L.) lines comprising Indian as well as exotic lines were screened for resistance to spot blotch disease during winter 2014-15 at hot spot locations i.e., Banaras Hindu University, Varanasi and Uttar Banga Krishi Vishwavidyalaya, Cooch Behar. Severity of the disease at different stages beginning from tillering to dough stage was recorded. Location Severity Index (LSI) of Varanasi was higher than Cooch Behar. Twenty eight accessions were resistant or highly resistant at both locations. These 28 accessions were validated during the winter season (2015)(2016). These germplasm were also evaluated at four environments for agronomic traits. Out of 28 accessions, seven (IC564121, IC529684, IC443669, IC443652, IC529962, IC548325 and EC178071-331) were highly resistant across the locations and over the years of study. These accessions comprised one exotic and six indigenous accessions belonging to Uttarakhand and Haryana. Two lines (IC529962 and IC443652) had higher yield than the best check at all the locations. These lines showing highly resistant reaction alongwith wider adaptability can be expedited for direct cultivation or for the development of high yielding and disease resistant cultivars. These lines can also be used for identification of novel resistance gene using allele mining tools and their deployment for the development of spot blotch resistant cultivars.

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Inheritance And Allelic Relationship Of Resistance Genes To Spot Blotch Of Wheat Caused By Bipolaris Sorokiniana

Cited by 13 publications

References 10 publications

Genomic characterization of drought tolerance-related traits in spring wheat

Genomic characterization of drought tolerance-related traits in spring wheat

Genetic Improvement and Crop Management Strategies to Minimize Yield Losses in Warm Non‐traditional Wheat Growing Areas due to Spot Blotch Pathogen Cochliobolus sativus

Identification of new donors for spot blotch resistance in cultivated wheat germplasm

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