2016
DOI: 10.1149/2.0851603jes
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Inhibition Effect of a Laser on Thickness Increase of p-Type Porous Silicon in Electrochemical Anodizing

Abstract: We demonstrate that the thickness increase of the porous layer on p-type (1-10 ohm-cm) silicon can be inhibited from hundreds to several nm/min in regular anodizing by exposure to He-Ne laser irradiation. During 2.0 mW laser irradiation, the growth in thickness was reduced to 5-6 nm/minute by anodizing with a current density of 10 mA/cm 2 . The inhibition effect on the thickness increase of porous silicon depends significantly on the laser power during a fixed anodizing time.

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Cited by 14 publications
(12 citation statements)
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“…Those porous silicon layer structures were in nano-scale, as confirmed in our previous studies. 24 In this work, several nanometres of NPS layers of various spectral colours were formed by varying the laser power and the BEA; thus, the anti-etching effect of the porous silicon layer was confirmed. When low laser power (0.1 mW) was used, the porous silicon was not confirmed, because the anti-etching phenomenon was not obvious.…”
Section: Resultsmentioning
confidence: 59%
“…Those porous silicon layer structures were in nano-scale, as confirmed in our previous studies. 24 In this work, several nanometres of NPS layers of various spectral colours were formed by varying the laser power and the BEA; thus, the anti-etching effect of the porous silicon layer was confirmed. When low laser power (0.1 mW) was used, the porous silicon was not confirmed, because the anti-etching phenomenon was not obvious.…”
Section: Resultsmentioning
confidence: 59%
“…Hence, Si nanocrystals may be perfectly formed within the tiny spaces, which are nanoscale in diameter. 48,49 Furthermore, PL measurements are a very simple method of detecting the possible existence of nanocrystals. 50 For etching silicon in HF (aq) , the Cu catalysis half-reaction comprises the half-chemical reaction at the 'anode', thereby inducing a hole current as follows:…”
Section: Cumentioning
confidence: 99%
“…Figure 1 shows the effect of the quasi-Fermi level formed by laser irradiation with anodization. For example, in the anodization of p-type silicon, the appearance of an n-quasi-Fermi level due to laser irradiation ( Figure 1 a) inhibits etching of silicon 17 and the formation of a green PL layer ( Figure 1 b). In contrast, the p-quasi-Fermi level that appears with laser irradiation ( Figure 1 c) promotes etching of the irradiated region on n-type silicon, forming a yellow PL spot ( Figure 1 d).…”
Section: Introductionmentioning
confidence: 99%