The phase diagram of complex oxides is very diverse due to the strong interaction between electrons in the electronic structure. It is possible to probe those interactions by changing electrostatically the carrier density, the main concept behind the Field-Effect Transistors (FET) which is the building blocks of nanoelectronics devices. [1][2][3] In the case of high-T C superconductor copper oxides, it is possible to use this concept to switch between superconducting and insulator phases, for example using an adjacent liquid electrolyte layer to inject charges in a superconducting film. 4 With that in mind, the objective of this work was to establish protocols to grow superconductor and ferroelectric films for future fabrication of superconducting FET devices. We optimized the deposition conditions for the growth of a single layer of superconductor YBa 2 Cu 3 O 7−x and the ferroelectric barium titanate on SrTiO 3 substrates by pulsed laser deposition (PLD). Several techniques were employed to study the properties of the thin films, such as X-ray diffraction, atomic force microscope, X-ray photoelectron spectroscopy, resistance vs temperature and ferroelectric hysteresis. Regarding the superconductors thin films, we observed several relations between the superconducting features and the growth parameters. For instance, lower growth temperatures contribute to the nucleation of a-axis oriented grains meanwhile higher growth temperature tends to be c-axis oriented. Regarding the frequency of the laser (proportional to the growth rate), it seems that lower frequency is related to higher surface roughness and the presence of non-superconducting contributions. As it increases, the roughness decrease and the sample presents a sharper superconducting transition. Finally, we also did the first steps towards the field effect device by growing a heterostructure thin film consisting of a superconductor and ferroelectric material. The sample grew c-axis oriented on strontium titanate substrate, though with a high value of surface roughness.