1997
DOI: 10.1109/77.622092
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Inhomogeneous response of superconducting tunnel junctions with a killed electrode for X-ray spectroscopy

Abstract: Nb-based superconducting tunnel junctions are being developed as high energy resolution X-ray detectors. Unfortunately, loss of excess quasiparticles at the edges, combined with lateral diffusion, results in an inhomogeneous response. To study this degradation of energy resolution, we manufactured detectors with a Ta trap in the top or bottom electrode away from the tunneling barrier. Excess quasiparticles in this so-called killed electrode will be trapped effectively and thus removed from the tunneling proces… Show more

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Cited by 21 publications
(7 citation statements)
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“…A similar discrepancy between predicted and measured diffusion constants in polycrystalline Nb films has also been reported. 20,21 The quasiparticle lifetime we measure is longer than that reported by others. 16 -18 The data previously reported by our group 16 was for a short device with Lϭ200 m, produced prior to the devices reported here.…”
Section: Resultscontrasting
confidence: 45%
“…A similar discrepancy between predicted and measured diffusion constants in polycrystalline Nb films has also been reported. 20,21 The quasiparticle lifetime we measure is longer than that reported by others. 16 -18 The data previously reported by our group 16 was for a short device with Lϭ200 m, produced prior to the devices reported here.…”
Section: Resultscontrasting
confidence: 45%
“…Nevertheless, the spatial distributions measured with the LTSEM were explained by a quasiparticle diffusion and edge loss model ͑QD model͒ and found to be consistent with actual x-ray energy spectra. 8,9 A straightforward way for imaging diagnosis is to scan STJ detectors with an x-ray microbeam. There are no reports on x-ray microbeam imaging experiments except for the pinpoint collimation experiments.…”
Section: ͓S0003-6951͑00͒01650-8͔mentioning
confidence: 99%
“…11 Junctions of two different wafers fabricated in a similar way and having comparable multilayer structures ͑Al6/1 and Al6/3͒ were investigated. Figure 2 shows the multilayer structure of two different types of junctions of wafer Al6/1.…”
Section: Methodsmentioning
confidence: 99%