Initial dielectric aging in a lead magnesium niobate ceramic under strong alternating current fields

Wang, Y.; Li, L.T.; Gui, Zhilun

doi:10.1016/s0167-577x(98)00060-3

Cited by 4 publications

(2 citation statements)

References 17 publications

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“…The aging rates of remanent polarization and dielectric constant of 10 m thick films are higher than that of the 60 m NKBT thick films. This frequency dependence can be attributed to the manifestation of the domain wall motion in dielectric aging, which is consistent with the conclusions proposed by Wu and Schulze 28 and Wang et al 29 The reorientation and alignment of the defect dipoles with the local polar domains provide a pinning field to the micropolar region, where the regions with larger micropolar volume will experience stronger pinning potential. This indicates that the enhanced domain wall activity is responsible for decreased dielectric aging at room temperature as the NKBT film thickness increases.…”

Section: Resultssupporting

confidence: 89%

Piezoelectric and dielectric aging of Bi0.5(Na0.82K0.18)0.5TiO3 lead-free ferroelectric thick films

Zhang

Jiang

Xiao

et al. 2010

Journal of Applied Physics

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Photovoltaic effect of lead-free (Na0.82K0.18)0.5Bi4.5Ti4O15 ferroelectric thin film using Pt and indium tin oxide top electrodesThe dielectric relaxation behavior of (Na0.82K0.18)0.5Bi0.5TiO3 ferroelectric thin film Ferroelectric Bi 0.5 ͑Na 0.82 K 0.18 ͒ 0.5 TiO 3 ͑NKBT͒ thick films have been prepared using screen printing on Pt electroded alumina substrates. The room-temperature dielectric constant of resulting 60 m thick NKBT film reaches as high as 823 at 1 kHz and the depolarization temperature, T d , locates at 130°C. The effect of amplitude and frequency of the applied ac field and the aging temperature as well as the Bi excess on the dielectric and piezoelectric aging characteristics are systemically studied. The results show that the dielectric and piezoelectric aging are associated with the reorientation of defect dipoles which stabilized the non-180°domain walls. By this reorientation the domain wall motions are clamped by a time dependent force resulting in the observed decrease in the dielectric and piezoelectric properties during the aging procedural. Moreover, the aging in NKBT thick films exhibits strong frequency dependence, which is caused by that the reorientation and alignment of the defect dipoles with the local polar domains provide a pinning field to the micropolar region, where the regions with larger micropolar volume will experience stronger pinning potential. The NKBT thick films added with 0.5 mol % Bi 2 O 3 exhibit relative lower aging rate of the dielectric constant and piezoelectric coefficient, resulting from the compensation of the Bi 3+ vacancies by the addition of small amount of excess Bi 2 O 3 .

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Section: Resultssupporting

confidence: 89%

Piezoelectric and dielectric aging of Bi0.5(Na0.82K0.18)0.5TiO3 lead-free ferroelectric thick films

Zhang

Jiang

Xiao

et al. 2010

Journal of Applied Physics

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“…On the other hand, an internal electrical field may be created by the dipoles orientation, which increases with time [28,29]. Then some originally modulatable micropolarizations are fixed by the internal electrical field and cannot contribute to the dielectric response [30]. Because the internal field increases with time, more micropolarizations are fixed gradually.…”

Section: Resultsmentioning

confidence: 99%

Dielectric and aging behavior of multiferroic YbMnO3 ceramics

Tang

et al. 2010

Journal of Alloys and Compounds

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An XPS study on the degradation of lead magnesium niobate-based relaxor ferroelectrics during nickel electroplating

Cao

Gui

2001

J. Mater. Chem.

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Initial dielectric aging in a lead magnesium niobate ceramic under strong alternating current fields

Cited by 4 publications

References 17 publications

Piezoelectric and dielectric aging of Bi0.5(Na0.82K0.18)0.5TiO3 lead-free ferroelectric thick films

Piezoelectric and dielectric aging of Bi0.5(Na0.82K0.18)0.5TiO3 lead-free ferroelectric thick films

Dielectric and aging behavior of multiferroic YbMnO3 ceramics

An XPS study on the degradation of lead magnesium niobate-based relaxor ferroelectrics during nickel electroplating

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