1991
DOI: 10.1103/physrevb.44.3471
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Initial growth of Bi films on a Si(111) substrate: Two phases of √3 × √3 low-energy-electron-diffraction pattern and their geometric structures

Abstract: The ordering of Bi on a Si(111)-7&&7 surface was studied as a function of overlayer coverage and deposition conditions using low-energy electron diff'raction (LEED) and Auger electron spectroscopy.We observed a one-third-monolayer and a saturated one-monolayer phase. Both phases displayed identical J3XJ3-R30' LEED symmetries. LEED intensity data were used to differentiate between the two phases and to determine a quantitative atomic geometry via a thorough dynamical LEED analysis.The structural characterizatio… Show more

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Cited by 72 publications
(31 citation statements)
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“…1(e). From previous studies it is known that Bi has two √ 3 superlattice phases on Si(111) which form depending on the initial coverage and the annealing process 18 . The α-phase forms at T > 640 K with 1 3 ML coverage in substrate units (1 ML = 7.83 × 10 14 atoms/cm 2 ) whereas the denser β-phase forms for temperatures below 640 K and has a coverage of 1 ML.…”
Section: Methodsmentioning
confidence: 99%
“…1(e). From previous studies it is known that Bi has two √ 3 superlattice phases on Si(111) which form depending on the initial coverage and the annealing process 18 . The α-phase forms at T > 640 K with 1 3 ML coverage in substrate units (1 ML = 7.83 × 10 14 atoms/cm 2 ) whereas the denser β-phase forms for temperatures below 640 K and has a coverage of 1 ML.…”
Section: Methodsmentioning
confidence: 99%
“…[14][15][16] This is associated with a significant surface mass transport of Si, because 0.24 ML of Si atoms are released as a result of the lifting of the 7 ϫ 7 surface reconstruction. 17 Performing the termination in a standard way at substrate temperature T s = 500°C and terminating with a Bi flux F Bi = 0.7 ML/ min for Ϸ10 min results in a need to incorporate 0.24 ML Si at the surface step edges in a relatively short time.…”
mentioning
confidence: 99%
“…[14][15][16] This is associated with a significant surface mass transport of Si, because 0.24 ML of Si atoms are released as a result of the PHYSICAL REVIEW B 75, 241309͑R͒ ͑2007͒…”
mentioning
confidence: 99%
“…Bi was deposited onto the substrate held at constant temperatures at a deposition rate of 0.1 ML/min. The coverage (ML) and deposition rate was calibrated in-situ by observing the completion of the Si(111)β-√ 3× √ 3-Bi phase [24] in the RHEED pattern. During the Bi deposition onto the Si(111)7 × 7 clean surface, the RHEED pattern in the incident azimuth was recorded continuously by a CCD camera to monitor the changes of the surface structures.…”
Section: Methodsmentioning
confidence: 99%