Injection of auxiliary electrons for increasing the plasma density in highly charged and high intensity ion sources

Odorici, F.; Malferrari, L.; Montanari, A.; Rizzoli, R.; Castro, G.; Celona, L.; Gammino, S.; Neri, L.

doi:10.1063/1.4933020

Cited by 2 publications

(1 citation statement)

References 7 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…In the last decade, several experiments have demonstrated the effectiveness of the insertion of external electrons into Electron Cyclotron Resonance Ion Sources (ECRIS) by means of electron guns (e-guns), to improve their performances either in terms of mean charge state or source stability [1][2][3]. Currently, the most reasonable explanation of this effect is that the insertion of an electron beam reduce the overall plasma losses, acting on the so-called Simon diffusion mechanism [4].…”

Section: Introductionmentioning

confidence: 99%

A novel technique for plasma diagnostics benchmarked by numerical simulations

et al. 2019

Self Cite

View full text Add to dashboard Cite

A: Auxiliary electrons can be successfully used as a diagnostic probe to deduce characteristics and dynamics of magnetically confined plasmas typical of Electron Cyclotron Resonance and Microwave Discharge Ion Sources, as well as to improve their performances and/or stability. To this scope, numerical simulations are a powerful tool to predict the effect of the interaction of an electron beam with the plasma: this paper presents an alternative way to deduce the plasma density by joining the results of numerical simulations with the diagnostic of the beam transmitted through the plasma. As will be shown, the applied numerical code is able to describe the dynamics of an electron beam, generated by an e-gun, propagating inside a plasma trap, with a magnetic configuration typical of microwave discharge ion sources, focusing on several effects such as ionizations, heating, space charge etc. The role played by the position of the e-guns with respect to the magnetic field profile will be also underlined. K: Accelerator modelling and simulations (multi-particle dynamics; single-particle dynamics); Ion sources (positive ions, negative ions, electron cyclotron resonance (ECR), electron beam (EBIS)); Plasma generation (laser-produced, RF, x ray-produced) 1Corresponding author.

show abstract

Section: Introductionmentioning

confidence: 99%

A novel technique for plasma diagnostics benchmarked by numerical simulations

et al. 2019

Self Cite

View full text Add to dashboard Cite

show abstract

Beam transport and space charge compensation strategies (invited)

Meusel

Droba

Noll

et al. 2016

Review of Scientific Instruments

View full text Add to dashboard Cite

The transport of intense ion beams is affected by the collective behavior of this kind of multi-particle and multi-species system. The space charge expressed by the generalized perveance dominates the dynamical process of thermalisation, which leads to emittance growth. To prevent changes of intrinsic beam properties and to reduce the intensity dependent focusing forces, space charge compensation seems to be an adequate solution. In the case of positively charged ion beams, electrons produced by residual gas ionization and secondary electrons provide the space charge compensation. The influence of the compensation particles on the beam transport and the local degree of space charge compensation is given by different beam properties as well as the ion beam optics. Especially for highly charged ion beams, space charge compensation in combination with poor vacuum conditions leads to recombination processes and therefore increased beam losses. Strategies for providing a compensation-electron reservoir at very low residual gas pressures will be discussed.

show abstract

Injection of auxiliary electrons for increasing the plasma density in highly charged and high intensity ion sources

Cited by 2 publications

References 7 publications

A novel technique for plasma diagnostics benchmarked by numerical simulations

A novel technique for plasma diagnostics benchmarked by numerical simulations

Beam transport and space charge compensation strategies (invited)

Contact Info

Product

Resources

About