2011
DOI: 10.1103/physrevlett.106.205501
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InN Thin Film Lattice Dynamics by Grazing Incidence Inelastic X-Ray Scattering

Abstract: Achieving comprehensive information on thin film lattice dynamics so far has eluded well established spectroscopic techniques. We demonstrate here the novel application of grazing incidence inelastic x-ray scattering combined with ab initio calculations to determine the complete elastic stiffness tensor, the acoustic and low-energy optic phonon dispersion relations of thin wurtzite indium nitride films. Indium nitride is an especially relevant example, due to the technological interest for optoelectronic and s… Show more

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Cited by 45 publications
(32 citation statements)
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References 20 publications
(27 reference statements)
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“…This value is in good agreement with experimental measurements 19 and with previous first-principles calculations. 20 In the case of rs-InN, the full structural relaxation yielded a lattice parameter of a = 4.523Å at ambient pressure and a zero-pressure bulk modulus of B 0 = 186 GPa, only slightly higher than the value measured by Uehara et al (170 ± 16 GPa). 8 For hydrostatic pressures of p = 15 GPa, just above the transition pressure, we find a bulk-modulus value of B 15 = 255 GPa.…”
Section: Ab Initio Calculationsmentioning
confidence: 62%
“…This value is in good agreement with experimental measurements 19 and with previous first-principles calculations. 20 In the case of rs-InN, the full structural relaxation yielded a lattice parameter of a = 4.523Å at ambient pressure and a zero-pressure bulk modulus of B 0 = 186 GPa, only slightly higher than the value measured by Uehara et al (170 ± 16 GPa). 8 For hydrostatic pressures of p = 15 GPa, just above the transition pressure, we find a bulk-modulus value of B 15 = 255 GPa.…”
Section: Ab Initio Calculationsmentioning
confidence: 62%
“…Indeed, IXS can be performed with samples as thin as 10–20 μm, which allow extending such studies up to Mbar pressure38. It is furthermore possible to work with evanescent wave fields in grazing angle conditions, which allows surface sensitive studies, measurements on thin films and multilayer systems3940.…”
Section: Discussionmentioning
confidence: 99%
“…The application of uniaxial expansion could be realized by bending thin films or using tensile load. TDS and IXS studies can be performed in such conditions in grazing incidence [28] or transmission geometry, respectively.…”
Section: Discussionmentioning
confidence: 99%