2025
DOI: 10.1016/j.jallcom.2024.177168
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Inspection and comparative analysis of light and thermal response dynamics of Cu/V₂O₅/n-Si and Cu/La-V₂O₅/n-Si MIS diodes

G. Alan Sibu,
V. Balasubramani,
Abdullah N. Alodhayb
et al.
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