Inspection of silver-sinter die attaches by pulsed and lock-in infrared thermography with flash lamp and laser excitation

Abstract

In this study we demonstrate the capabilities of the IR thermography for the inspection of silver-sinter die attaches. Sintered specimens such as 15 x 15 mm² dummy dies sintered on AMB substrates have been measured by pulsed infrared thermography (PIRT), lock-in infrared thermography (LIT) and as a reference by scanning acoustic microscopy. PIRT and LIT will be compared with the focus on the applicability in production lines. Both methods usually need a sample surface blackening which will be avoided here. This need of a sample preparation by blackening or other coating for sample surfaces with low emissivity and absorptivity is one of the main reasons for the low technology adoption of thermography methods for the inspection of thermal interfaces in electronics in industry.