Instantaneous microwave frequency measurement using four-wave mixing in a chalcogenide chip

Pagani, Mattia; Vu, Khu; Choi, Duk‐Yong; Madden, Steve; Eggleton, Benjamin J.; Marpaung, David

doi:10.1016/j.optcom.2015.06.079

Cited by 14 publications

(6 citation statements)

References 32 publications

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“…In this paper, we considered RFSA based on XPM as the nonlinear optical effect. FWM is another nonlinear optical effect that has been used to perform IFM for microwave sensing applications [49][50][51]. Simultaneous wavelength conversion of two optical signals based on FWM has been demonstrated using the MSND [41].…”

Section: Discussionmentioning

confidence: 99%

Simultaneous Multi-Channel Microwave Photonic Signal Processing

Chen

Moslemi

et al. 2017

Photonics

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Microwave photonic (MWP) systems exploit the advantages of photonics, especially with regards to ultrabroad bandwidth and adaptability, features that are significantly more challenging to obtain in the electronic domain. Thus, MWP systems can be used to realize a number of microwave signal processing functions including, amongst others, waveform generation and radio-frequency spectrum analysis (RFSA). In this paper, we review recent results on fiber and integrated approaches for simultaneous generation of multiple chirped microwave waveforms as well as multi-channel RFSA of ultrahigh repetition optical rate pulse trains.

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Section: Discussionmentioning

confidence: 99%

Simultaneous Multi-Channel Microwave Photonic Signal Processing

Chen

Moslemi

et al. 2017

Photonics

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“…However, for optical power mapping system, only low-cost low-speed PDs are needed, which can reduce the system cost effectively. Such schemes are usually implemented by optical mixing [27]- [31] or optical filtering [32]- [38]. In the optical mixing scheme, the system is complex and bulky, and the measurement error is usually large.…”

Section: Introductionmentioning

confidence: 99%

A Microwave Frequency Measurement System Based on Si3N4 Ring-Assisted Mach-Zehnder Interferometer

et al. 2020

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A microwave frequency measurement system based on a ring assisted Mach-Zehnder interferometer (RAMZI) with a large measurement range and high accuracy is proposed and experimentally demonstrated. By using single-sideband modulation, the microwave signal with unknown frequency is converted to an optical sideband signal, which is used to probe the two complementary output optical powers of the ring-assisted Mach-Zehnder interferometer, then a fixed frequency-to-power mapping is established by obtaining a highly linear amplitude comparison function (ACF). High-precision frequency measurement with a root mean square error (RMSE) of less than 30MHz was achieved in a frequency range of 5.2GHz, and relative low-precision frequency measurement with a RMSE of less than 102MHz was achieved in a frequency range of 11GHz. Besides, in order to break the trade-off between measurement range and measurement accuracy, a multi-band measurement method was implemented and frequency measurement range of 5~39 GHz with RMSE lower than 37MHz was achieved.

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“…They form an important class of inorganic materials studied many years for their specific properties leading to many interesting applications. Amorphous chalcogenides present unusual characteristics such as a wide transparency in the infrared range (≈1‐12 μm for sulfides, ≈1‐16 μm for selenides and ≈2‐20 μm for tellurides), photosensitivity, high linear‐ and non‐linear refractive index and a suitable shaping ability (to fabricate fibers or thin films). Thereby various applications were developed using chalcogenide glasses: chemical and biochemical sensors, components for high speed all‐optical processing of telecommunications signals or phase change materials for rewritable data storage …”

Section: Introductionmentioning

confidence: 99%

X‐ray photoelectron spectroscopy analysis of Ge–Sb–Se pulsed laser deposited thin films

et al. 2018

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Pulsed laser deposition was used to prepare amorphous thin films from (GeSe 2 ) 100Àx (Sb 2 Se 3 ) x system (x = 0, 5, 10, 20, 30, 40, 50, and 60). From a wide variety of chalcogenide glass-forming systems, Ge-Sb-Se one, especially in thin films form, already proved to offer a great potential for photonic devices such as chemical sensors. This system has a large glass-forming region which gives the possibility to adjust the chemical composition of the glasses according to required physical characteristics. The chemical composition of fabricated thin films was analyzed via X-ray photoelectron spectroscopy (XPS) and compared to energy dispersive spectroscopy (EDS) data. The results of both techniques agree well: a small deficiency in chalcogen element and an excess of antimony was found. The structure of as-deposited thin films has been investigated by XPS. The presence of the two main structural units, [GeSe 4 ] and [SbSe 3 ] proposed by Raman scattering spectroscopy data analysis, was confirmed by XPS. Moreover, XPS core level spectra analysis revealed the presence of M-M bonds (M = Ge, Sb) in (Ge,Sb)-Ge-(Se) 3 and (Ge,Sb)-Sb-(Se) 2 entities that could correspond to Ge-based tetrahedra and Sb-based pyramids where one of its Se atoms at corners is substituted by Ge or Sb ones. The content of depicted M-M bonds tends to increase with introduction of antimony in the amorphous network of as-deposited thin films from x = 0 to x = 40 and then it decreases. XPS analysis of as-deposited thin films shows also the presence of the (Ge,Sb)-Se-(Ge,Sb) and Se-Se-(Ge,Sb) entities.

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Instantaneous microwave frequency measurement using four-wave mixing in a chalcogenide chip

Cited by 14 publications

References 32 publications

Simultaneous Multi-Channel Microwave Photonic Signal Processing

Simultaneous Multi-Channel Microwave Photonic Signal Processing

A Microwave Frequency Measurement System Based on Si3N4 Ring-Assisted Mach-Zehnder Interferometer

X‐ray photoelectron spectroscopy analysis of Ge–Sb–Se pulsed laser deposited thin films

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