2016
DOI: 10.1253/circj.cj-15-1012
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Insulin Resistance as a Predictor of the Late Catch-up Phenomenon After Drug-Eluting Stent Implantation

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Cited by 4 publications
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“…In particular insulin treated diabetes is an independent and strong predictor of late and repeat coronary revascularization [24]. Intriguingly, in the general population treated with PCI, insulin resistance promoted the “late catch-up phenomenon”, a restenosis due to continuous neointimal growth during long-term follow-up, after first generation DES implantation [25]. Indeed, the Casale Monferrato study suggested that, insulin resistance was associated to natriuretic peptides serum levels, with lower circulating levels in insulin-resistance non diabetic people, and higher values in the upper spectrum of metabolic abnormalities, such as diabetes with the metabolic syndrome [26].…”
Section: Discussionmentioning
confidence: 99%
“…In particular insulin treated diabetes is an independent and strong predictor of late and repeat coronary revascularization [24]. Intriguingly, in the general population treated with PCI, insulin resistance promoted the “late catch-up phenomenon”, a restenosis due to continuous neointimal growth during long-term follow-up, after first generation DES implantation [25]. Indeed, the Casale Monferrato study suggested that, insulin resistance was associated to natriuretic peptides serum levels, with lower circulating levels in insulin-resistance non diabetic people, and higher values in the upper spectrum of metabolic abnormalities, such as diabetes with the metabolic syndrome [26].…”
Section: Discussionmentioning
confidence: 99%