Integrated precision inspection system for manufacturing of moulds having CAD defined features

Pahk, Heui Jae; Jung, Mooyoung; Hwang, Sekyu; Kim, Y. H.; Hong, Yeh-Sun; Kim, S. G.

doi:10.1007/bf01179348

Cited by 29 publications

(13 citation statements)

References 6 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…This is the simplest criterion, resulting in the surface being broken down into a rectangular grid, with even u-v spacing across the whole of the surface [14]. Chord length criterion.…”

Section: Proposed Methodologymentioning

confidence: 99%

“…Local sampling density is controlled by specifying the maximum chordal deviation, this being the largest distance between a line connecting any two adjacent points and the surface. The resulting point density is therefore dependent on the local surface curvature [14] and, as Fig. 4 shows, this criterion allows a higher point density at locations of high curvature.…”

Section: Proposed Methodologymentioning

confidence: 99%

See 1 more Smart Citation

CAD-Based Measurement Path Planning for Free-Form Shapes Using Contact Probes

Ainsworth

Ristić

Brujić

2000

Int J Adv Manuf Technol

122

View full text Add to dashboard Cite

Dimensional inspection of engineering components comprising free-form surfaces demands accurate measurement of a large number of discrete points, such that the actual shape may be fully characterised. This paper presents a methodology for CAD-based measurement of such components using a coordinate measuring machine equipped with a touch-trigger probe. The main shortcomings of the conventional methodology have been identified to be in relation to registration and probe radius compensation. The proposed measurement process involves the following main steps: registration, definition of measurement points, probe path generation, path optimisation and verification, measurement and probe radius compensation. By employing the CAD model at every step, the implemented methodology maximises the measurement accuracy and this is verified through a detailed simulation study. In addition, the implemented tools for CMM programming achieve accurate control of the overall measurement process and provide a high level of confidence when dealing with complex component geometry.

show abstract

“…This is the simplest criterion, resulting in the surface being broken down into a rectangular grid, with even u-v spacing across the whole of the surface [14]. Chord length criterion.…”

Section: Proposed Methodologymentioning

confidence: 99%

Section: Proposed Methodologymentioning

confidence: 99%

CAD-Based Measurement Path Planning for Free-Form Shapes Using Contact Probes

Ainsworth

Ristić

Brujić

2000

Int J Adv Manuf Technol

122

View full text Add to dashboard Cite

show abstract

“…These methods are used to quantify the results of profilometric measurements in terms of different surface roughness parameters. [1][2][3][4] However, these parameters cannot successfully describe surface irregularity or complexity. Especially, precise topography characterization of surfaces with asymmetric roughness cannot be achieved through conventional roughness parameters because there is a shift between the mean surface level and the true surface.…”

Section: Introductionmentioning

confidence: 99%

Comparative study of direct and indirect image‐based profilometry in characterization of surface roughness

Pavlović

Risović

Novaković

2012

Surface & Interface Analysis

View full text Add to dashboard Cite

a In this study, we have investigated and compared two different approaches to the characterization of surface structure and roughness. The results of the stylus profilometric method are compared with the results obtained using a relatively novel, indirect, image-based profilometry. The aim was to evaluate the performance and practical usefulness of the indirect method in the characterization of a surface topography. The indirect approach involved the use of Gwyddion software for analysis of scanning electron microscope (SEM) images and calculation of standard profilometric parameters. It is well known that SEM micrographs provide an excellent tool for visualization and qualitative description of surface topography, including the estimation of corresponding fractal dimensions. The results of this study demonstrate that it is also possible to obtain profilometric parameters from analysis of SEM micrographs with appropriately calibrated gray scale intensity distributions, and that the values of the parameters are comparable to those obtained by classical (stylus) profilometry. Better agreement with results of the direct profilometric method was achieved for parameters related to the distribution of heights than those related to the distribution of depths. Regarding these differences, we have provided arguments indicating that the values of these depths -related parameters obtained by indirect profilometry -are closer to the "true" values than those inferred from the direct profilometry. Generally, the results of this comparative study indicate that indirect image-based profilometry is a valuable and efficient tool in the characterization of various surface's topographies.

show abstract

“…Examples include aeroengine components, car body panels and various dies [1,2]. Dimensional measurement of such parts is generally performed as part of:…”

Section: Introductionmentioning

confidence: 99%

Contact probe radius compensation using computer aided design models

Ristić

Ainsworth

Brujić

2001

Proceedings of the Institution of Mechanical Engineers, Part B:

View full text Add to dashboard Cite

Probe radius compensation is necessary in metrology applications that employ contact probes, but it can be a signi® cant source of systematic measurement errors when dealing with freeform part geometry. The paper presents implementation and performance analysis of a proposed new compensation technique based on the nominal computer aided design (CAD) model, which is assumed to be de® ned using non-uniform rational B-splines (NURBS). Errors associated with the conventional compensation approach are assessed on the basis of experiments using a modern coordinate measuring machine (CMM), providing clear motivation for this work. The proposed method consists of a number of steps, including measurement, generation of oVset nominal surfaces, registration, surface ® tting, data smoothing and calculation of compensating oVsets. Critical steps include registration and NURBS surface ® tting and their implementation is presented. Simulation studies are used to analyse the registration accuracy and the accuracy of the overall method in comparison with the conventional one. The proposed method is shown to produce superior results in situations involving non-uniform measurement distribution, measurement noise, free-form geometry with no clear datums, deformation relative to the nominal shape and component misalignment.

show abstract

Integrated precision inspection system for manufacturing of moulds having CAD defined features

Cited by 29 publications

References 6 publications

CAD-Based Measurement Path Planning for Free-Form Shapes Using Contact Probes

CAD-Based Measurement Path Planning for Free-Form Shapes Using Contact Probes

Comparative study of direct and indirect image‐based profilometry in characterization of surface roughness

Contact probe radius compensation using computer aided design models

Contact Info

Product

Resources

About