2014 IEEE 64th Electronic Components and Technology Conference (ECTC) 2014
DOI: 10.1109/ectc.2014.6897513
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Integrated process characterization and fabrication challenges for 2.5D IC packaging utilizing silicon interposer with backside via reveal process

Abstract: Conventional IC packaging requires device chips or dice to be packaged at the same level in a way we generally imagined, while newly developed and thriving 3D IC packaging utilizes skyscraper concept to stack numerous types of device chips with different functions occupying the exact same or similar footprint. This approach not only reduces overall package dimension and thickness, but also improves electronic interconnection performance, as well as provides other advantages like lower power dissipation and gre… Show more

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