2008
DOI: 10.1088/0022-3727/41/5/052003
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Integrated properties of large lateral photovoltage and positive magnetoresistance in Co/Mn/Co/c-Si structures

Abstract: Both lateral photovoltage (LPV) and positive magnetoresistance (MR) are observed in Co/Mn/Co/c-Si structure. The LPV shows a large sensitivity of 10 mV mm−1 as a laser spot is moved on a film surface. An apparent positive MR of 2.8% (at 4.2 K) is also found in the structure and is explained based on the enhanced scattering at the interface. The LPV is discussed in terms of the metal–semiconductor junction that exists between the film and the Si substrate. The combined properties add functionality to the single… Show more

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Cited by 24 publications
(15 citation statements)
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“…Moreover, in some cases, LPE is also sensitive to the external conditions including magnetic field and voltage bias . In particular, the magnetic susceptibility are strongly correlated with the metallic materials adopted in the systems . Wang et al.…”
Section: Lateral Photovoltaic Effectmentioning
confidence: 99%
“…Moreover, in some cases, LPE is also sensitive to the external conditions including magnetic field and voltage bias . In particular, the magnetic susceptibility are strongly correlated with the metallic materials adopted in the systems . Wang et al.…”
Section: Lateral Photovoltaic Effectmentioning
confidence: 99%
“…The range of application of such detectors is quite extensive and involves automatic control, positioning, surface profiling and other systems [7,8,9]. Surprisingly, the LPE appeared to be sensitive to external magnetic fields [10,11,12,13]. It is not excluded that the possibility of magnetic-field control of the LPV will open the way to fabrication of novel detectors and sensors or implementation of additional functionalities of the available devices.…”
Section: Introductionmentioning
confidence: 99%
“…The particular interest shown in Co/SiO 2 /Si structures is related to the possibility of developing broadband PSD for the visible, ultraviolet or infrared range [14][15][16] by adjusting the Co thickness. Previous studies of MOS structures, including Co/SiO 2 /Si, investigated the LPE by illuminating steadily a relatively large rectangular samples (about 10×10 mm 2 ).…”
Section: Introductionmentioning
confidence: 99%