2017
DOI: 10.1016/j.apenergy.2017.05.034
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Intelligent fault diagnosis of photovoltaic arrays based on optimized kernel extreme learning machine and I-V characteristics

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Cited by 280 publications
(145 citation statements)
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“…Chen et al [21] used a principal component analysis and support vector machine to classify the faults in PV systems. Some scholars used the extreme learning machine [22] and fuzzy clustering method [23] to classify the obtained data and then identified the various faults of the PV array. Chen et al [24] used the random forest ensemble learning algorithm for fault detection of PV array.…”
Section: Introductionmentioning
confidence: 99%
“…Chen et al [21] used a principal component analysis and support vector machine to classify the faults in PV systems. Some scholars used the extreme learning machine [22] and fuzzy clustering method [23] to classify the obtained data and then identified the various faults of the PV array. Chen et al [24] used the random forest ensemble learning algorithm for fault detection of PV array.…”
Section: Introductionmentioning
confidence: 99%
“…In addition, some researchers suggest that the random forest (RF) ensemble learning algorithm and the emerging kernel based extreme learning machine (KELM) are explored for the detection and diagnosis of PV arrays early faults (including line-line faults, degradation, open circuit and partial shading). They are also based on the accurate acquisition of current-voltage (I-V) curve [12,13].…”
Section: Introductionmentioning
confidence: 99%
“…Due to the aforementioned considerations, fault detection and diagnosis of PV systems has seen a particular interest in the last few decades, where several research studies and investigation have addressed the issue [13]. These methods are mainly classified into two categories: conventional threshold approaches and machine learning based approaches [7]. In conventional threshold approaches, fault detection and diagnosis can be achieved by analyzing several electrical indicators, such as operating current and voltage, and the output generated power.…”
Section: Introduction : 1state Of the Artmentioning
confidence: 99%
“…This type of network suffers from its slow training steps, and it could fall in local minima instead of global minima. These weaknesses could affect its reliability, efficiency and even its realtime implementation [7]. Moreover, this kind of network requires a lot of high-quality labeled data that describes very well the process [7].…”
Section: Introduction : 1state Of the Artmentioning
confidence: 99%