Interaction between chromium and oxidized polyphenylquinoxaline surfaces

Bellard, L.; Ammar, C. Fauquet‐Ben; Themlin, J.‐M.; Cros, A.

doi:10.1063/1.361875

Cited by 4 publications

(4 citation statements)

References 22 publications

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“…Another structure is needed at 401 eV to complete the reconstitution and was previously attributed to oxidized nitrogen species. 15 The formation of new carbon and nitrogen electron-rich species were already observed upon chromium metallization of plasma-treated PPQ surfaces. 15 Chromium, with its high heat of formation for compounds, is a particularly reactive transition metal, even towards a number of polymers.…”

Section: A Interface Formationmentioning

confidence: 97%

“…15 The formation of new carbon and nitrogen electron-rich species were already observed upon chromium metallization of plasma-treated PPQ surfaces. 15 Chromium, with its high heat of formation for compounds, is a particularly reactive transition metal, even towards a number of polymers. [5][6][7][8][9][10][11] This reactivity plays a crucial role in the growth mode on the polymer which, in a simple picture, can be expected to grow essentially in a twodimensional fashion.…”

Section: A Interface Formationmentioning

confidence: 97%

“…Three of them come from the PPQ surface before metallization ͑see Table I for assignments 3,14 ͒, while a fourth at 283 eV is characteristic of the interface formation. For some spectra, an additional component located at 288 eV and attributed to oxidized carbon species 15 is needed to improve the fit.…”

Section: A Interface Formationmentioning

confidence: 99%

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Physical and chemical properties of the chromium/polyphenylquinoxaline interface

Bellard¹,

Ammar²,

Themlin³

et al. 1998

Journal of Applied Physics

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Kinetic energy influences on the growth mode of metal overlayers on dendrimer mediated substrates J. Vac. Sci. Technol. A 21, 234 (2003); 10.1116/1.1531137 Evidence for metal interaction in gold metallized polycarbonate films: An x-ray photoelectron spectroscopy investigationThe very first stages of the chromium/polyphenylquinoxaline interface formation are investigated. X-ray photoelectron spectroscopy data evidence that new carbon and nitrogen electron-rich species are formed, necessarily implying cycle opening and bond breaking, associated with polymer disruption. Complementary experiments performed on chromium nitride and on chromium deposited on amorphous carbon films show that mostly chromium carbides and nitrides are formed during chromium interaction with the polymer. The outermost topography is studied by ex situ near-field microscopies. Chromium, with its high reactivity towards the polymer, essentially grows in a layer-by-layer mode. However, for chromium coverages higher than 60 Å, a dense network of cracks spontaneously forms, indicating a mixed-mode failure ͑cohesive in the chromium film and adhesive at the interface͒.

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Section: A Interface Formationmentioning

confidence: 97%

Section: A Interface Formationmentioning

confidence: 97%

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Physical and chemical properties of the chromium/polyphenylquinoxaline interface

Bellard¹,

Ammar²,

Themlin³

et al. 1998

Journal of Applied Physics

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“…Recent experiments revealed that C=O and aromatic sites on a polymer surface interacted with Al, Cu, Ti, and Cr metals, and metal-polymer complexes such as metal-O-C and metal-C were formed depending on metal and polymer materials. 5 Chemical bond formation at an organic/inorganic interface and its effect on the junction properties are still somewhat controversial.6 '7 In order for organic films to offer viable alternatives to inorganics, intimate interaction between the two layers is required since highly efficient electron exchange between the layers and long-term stability of inorganic junction devices are based on the interaction. For the past several years, we have investigated junction properties of a p-type conducting polymer/n-Si contact as a model for inorganic/organic junctions.…”

Section: Introductionmentioning

confidence: 99%

Enhancement in Chemical Interaction at Conducting Polymers/n‐Si Interfaces by Their Electroreduction

Hoshino

Tokutomi

Iwata

et al. 1998

J. Electrochem. Soc.

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Studies of chemical and electronic interaction at organic/inorganic interfaces are described. Electrochemical deposition of conducting polymers [poly(3-methylthiophene), polythiophene, poly(3-methylpyrrole), polypyrrole, poly(3methyithiophene-co-pyrrole)] on an n-Si wafer does not give rise to high-quality p-n heterojunctions, but it is found that their junction properties are greatly improved by their electrochemical reduction (cathodic treatment). For example, the cathodic treatment of an as-grown poly(3-methylthiophene)/n-Si junction cell with rectifying ratio, y, of 1.4 x 10' and diode factor, n, of 2.6 gives a high quality junction with y = 1.7 X io and n = 1.2. The treatment involves not only the development of polymer films but the improvement in junction interface, since the treatment can contribute to the improvement only when conducted in the presence of polymer films. In order to understand this modification at the interface, the effects of cathodic treatment conditions (treatment potential and time) and the presence of an interfacial oxide layer on the junction properties are investigated. As a result, it is revealed that the improvement is explained by a junction formation model described as the evolution of covalent bond formation at the interface. Further electrochemical studies reveal that such bondings are disrupted by hydrolysis and/or oxidation, and the bond disruption model is used to describe the degradation of the junctions in the air.

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Electronic Properties at the Junction Interfaces between Anodic Titanium Oxide Films and Conducting Polymers

Ogawa

Takase

Kitamura

et al. 2004

Journal of The Surface Science Society of Japan

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Poly (3-methylthiophene) (P 3 MeT) films were electrochemically deposited on titanium oxide (TiOX) layers prepared by anodic oxidation of titanium plates, and the chemical and electronic interaction at the P 3 MeT／TiOX p-n heterojunction interfaces were investigated by current-voltage and capacitance-voltage measurements. The junction properties (diode factor, rectifying ratio, barrier height and built-in potential) of the cells were spontaneously improved during their storage in the air, and the extent of the improvement was higher when the TiOX was prepared at a lower one (5 V) than in the case of a higher oxidation bias (20 V). These experimental findings were well explained by using a junction formation model described as the evolution of covalent bond formation at the interface, in which chemically active species on the TiOX surface are linked to the P 3 MeT and increase in number with decreasing the anodic oxidation potential. This model was experimentally supported by the contact potential difference measurements of the TiOX films.

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Interaction between chromium and oxidized polyphenylquinoxaline surfaces

Cited by 4 publications

References 22 publications

Physical and chemical properties of the chromium/polyphenylquinoxaline interface

Physical and chemical properties of the chromium/polyphenylquinoxaline interface

Enhancement in Chemical Interaction at Conducting Polymers/n‐Si Interfaces by Their Electroreduction

Electronic Properties at the Junction Interfaces between Anodic Titanium Oxide Films and Conducting Polymers

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