“…The first is vacuum-based techniques to detect the total hydrogen concentration (including secondary ion mass spectroscopy [SIMS], 62,118 atom probe tomography [APT], 119,120 and glow discharge optical emission spectroscopy [GDOES] 121 ). The second is the detection of hydrogen complexes such as hydrogen-metal, 75,[122][123][124][125][126] hydrogendefect, [127][128][129] or hydrogen dimers, [130][131][132] typically using infrared or Raman spectroscopy, [130][131][132][133] deep level transient spectroscopy (DLTS), 98,122,123,127,134,135 or electron paramagnetic resonance (EPR). 126,129 A third is the observation of hydrogen deactivation of dopant impurities 92,99,100,136 via changes in resistivity, either locally using capacitance voltage methods 92,99 or throughout the entire silicon bulk.…”