2008
DOI: 10.1103/physrevb.78.195308
|View full text |Cite
|
Sign up to set email alerts
|

Interaction effects in conductivity of a two-valley electron system in high-mobility Si inversion layers

Abstract: We have measured the conductivity of high-mobility (001) Si metal-oxide-semiconductor field effect transistors (MOSFETs) over wide ranges of electron densities n = (1.

Help me understand this report
View preprint versions

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

11
58
0

Year Published

2015
2015
2023
2023

Publication Types

Select...
7

Relationship

1
6

Authors

Journals

citations
Cited by 37 publications
(69 citation statements)
references
References 72 publications
11
58
0
Order By: Relevance
“…This qualitative model is roughly similar to the charged trap model by Alltshuler and Maslov [93], but relates the traps with the spin droplets inside the 2D layer, rather than with defects at the Si-SiO 2 interface. In principle, the presence of the spin droplets is expected to cause saturation of the temperature dependence of the phase breaking time [94], however, we did not reveal the τ ϕ saturation down to about 30 mK [58]; possible explanation of the low saturation temperature is discussed in Ref. [94].…”
Section: Possible Origin Of the Two Channel Scatteringmentioning
confidence: 65%
See 2 more Smart Citations
“…This qualitative model is roughly similar to the charged trap model by Alltshuler and Maslov [93], but relates the traps with the spin droplets inside the 2D layer, rather than with defects at the Si-SiO 2 interface. In principle, the presence of the spin droplets is expected to cause saturation of the temperature dependence of the phase breaking time [94], however, we did not reveal the τ ϕ saturation down to about 30 mK [58]; possible explanation of the low saturation temperature is discussed in Ref. [94].…”
Section: Possible Origin Of the Two Channel Scatteringmentioning
confidence: 65%
“…[67]). For high-mobility samples, the upturn sets upon lowering temperature, (T < 1/τ ; T < τ v ), where the effective number of triplet terms diminishes [58], and/or at higher densities where F σ 0 diminishes [20,24,59,69,70]; these low-temperature and high-density regimes are out of sight in Fig. 2.…”
Section: High-and Low-mobility Samplesmentioning
confidence: 99%
See 1 more Smart Citation
“…These measurements were carried out by different experimental groups and, furthermore, were performed on silicon field-effect structures made by different manufacturers. According to 4,10 , the experimental data obtained for the effective mass can be well described by the interpolation formula m = 0.205m e (1 + 0.035r s + 0.00016r…”
Section: Pacs Numbersmentioning
confidence: 99%
“…These measurements were carried out by different experimental groups and, furthermore, were performed on silicon field-effect structures made by different manufacturers. According to 4,10 , the experimental data obtained for the effective mass can be well described by the interpolation formula m = 0.205m e (1 + 0.035r s + 0.00016rin the range 8 > r s > 1.5, where r s = 2.63(10/n s ) 1/2 and the electron density is measured in units of 10 11 cm −2 . Figure 1 shows the dependence of the effective mass on the electron density as a plot of m b n s /m versus n s , where m b = 0.19m e is the band effective mass.…”
mentioning
confidence: 99%