“…Consequently, in the vicinity of EMF sources, various hazards for implant users need to be identified and evaluated, especially for users of AIMD. In the systematic considerations, the EMF influence on AIMD functions may be split into the following groups (where it is not excluded that they will present together): -influence on the electric circuit of the AIMD, -influence on the internal memory of the AIMD, -influence on mechanical structures -by heating, reposition, etc., Pacing inhibition (complete or temporary stop of pacing); the implant interprets electrical potentials from EMF electrodynamic interaction as the proper heart rate and stops the pacing, even in the absence of the intrinsic heart rate EAS systems [5,6]; induction hobs (25-34 kHz) [7]; GSM [6,[8][9][10]; vicinity of BTS [11,12]; MD gates [13]; MRI scanners (1.5 T) [6,14]; ESU [6,15] CP [11,12]; 3.4. 400 kV power lines [19]; 3.5.…”