2002
DOI: 10.1088/0953-8984/14/34/315
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Interactions of point defects with dislocations in n-type silicon-doped GaAs

Abstract: Raman scattering and cathodoluminescence experiments have been performed to investigate the effect of dislocations on the spatial distribution of point defects and on the free electron concentration in n-type GaAs:Si. An experimentally extended increase of the free electron and (SiGaVGa)2− complex concentrations from the matrix to the dislocation is explained as resulting from the formation of arsenic precipitates around the dislocation by means of computer simulations based on a diffusion–aggregation model.

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Cited by 4 publications
(3 citation statements)
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“…Experimentally, the FEC is determined by the peak position of the L ϩ LO phonon-plasmon coupling mode in the Raman spectrum. 6 The formation of arsenic clusters in the simulation (␣ϭ1) extends the radius of in-creased FEC up to 10 m beyond the dislocation ͓see Fig. 3͑a͔͒, in agreement with the Raman scattering experiments.…”
supporting
confidence: 81%
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“…Experimentally, the FEC is determined by the peak position of the L ϩ LO phonon-plasmon coupling mode in the Raman spectrum. 6 The formation of arsenic clusters in the simulation (␣ϭ1) extends the radius of in-creased FEC up to 10 m beyond the dislocation ͓see Fig. 3͑a͔͒, in agreement with the Raman scattering experiments.…”
supporting
confidence: 81%
“…[3][4][5] The formation of arsenic clusters around dislocations has been related to the increase in the free-electron concentration ͑FEC͒ from the matrix to dislocations in GaAs:Si. 6 It is thus of fundamental interest to clarify why arsenic clusters prefer to stay at dislocations and not in the matrix. The computer simulations presented here will show that it is energetically and kinetically favorable for arsenic clusters to stay at dislocations.…”
mentioning
confidence: 99%
“…The band A around 1.50 eV is due to the near band-gap-related emission (NBE); the band B at 1.33 eV originates from the transition from states near the conduction band to the energy level of B − As , i.e. (eB − As ) [13,14]; the band C at 1.14 eV is connected to (Si Ga V Ga ) complexes [6][7][8]. The origin of the band D at 0.95 eV cannot be determined at this stage.…”
Section: Resultsmentioning
confidence: 99%