2020
DOI: 10.1007/978-981-15-7090-2_17
|View full text |Cite
|
Sign up to set email alerts
|

Interconnect Quality and Reliability of 3D Packaging

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2021
2021
2023
2023

Publication Types

Select...
1
1

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
(1 citation statement)
references
References 58 publications
0
1
0
Order By: Relevance
“…The soldered copper/tin based contacts are the weakest part of the chip that can be related to intermetallics and the Kirkendall-Frenkel porosity formation in the contact zone [3,4,7]. One of the most common reasons for chip failure is the soldered.…”
Section: Introductionmentioning
confidence: 99%
“…The soldered copper/tin based contacts are the weakest part of the chip that can be related to intermetallics and the Kirkendall-Frenkel porosity formation in the contact zone [3,4,7]. One of the most common reasons for chip failure is the soldered.…”
Section: Introductionmentioning
confidence: 99%