2001
DOI: 10.1002/sia.1086
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Interface analysis with the three‐dimensional atom probe

Abstract: The application of the technique of atom probe tomography to the atomic scale characterization of interfaces and surface films is described. The three-dimensional atom probe determines the coordinates and elemental identities of the atoms in a small volume of a sample with near-atomic precision. The types of analyses that may be performed on interfaces are demonstrated by examples taken from a variety of materials, including neutron-irradiated pressure-vessel steel welds, superalloys, surface films and model a… Show more

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Cited by 19 publications
(8 citation statements)
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“…The generated proxigrams (i.e. proximity histograms) [41][42] for different γ and γ' interfaces confirm that W has a very strong tendency to partition to the γ' phase, unlike Al, in agreement with the phase diagram. The sum of Al and W contents in the γ' phase is close to 25 at.…”
Section: Temporal Evolution Of Phase Compositionsupporting
confidence: 67%
“…The generated proxigrams (i.e. proximity histograms) [41][42] for different γ and γ' interfaces confirm that W has a very strong tendency to partition to the γ' phase, unlike Al, in agreement with the phase diagram. The sum of Al and W contents in the γ' phase is close to 25 at.…”
Section: Temporal Evolution Of Phase Compositionsupporting
confidence: 67%
“…The transformations are accompanied via partition of different alloying elements, as investigated using atom probe tomography (APT).The APT results from edge and center regions of the laser track show clear segregation of B and Si to these distinct regions within the reconstructed volume (Figures 6 and 7). A suitable isoconcentration (isosurface) is choosen in such a way that it delineated both the phases, and then a proximity histogram is generated across the interface to determine partitioning of the elements into the respective phases 27,28. The 80 at.…”
mentioning
confidence: 99%
“…that is kept at a standing voltage while a local electrode is given a pulsed voltage. The sample is traditionally prepared into a sharp needle shape with a tip radius on the order of 100 nm by electropolishing a wire sample or using a focused ion beam to mill a tip~Larson et al, 2001;Zhou et al, 2001;Thompson et al, 2004;Miller et al, 2005!. The standing voltage on the sample is kept close to the voltage needed for field evaporation, and the pulsed voltage on the local electrode is used to increase the field just enough to allow one atom to field evaporate.…”
Section: Atom Probe Tomographymentioning
confidence: 99%