1999
DOI: 10.1063/1.369731
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Interface characterization of nanocrystalline CdS/Au junction by current–voltage and capacitance–voltage studies

Abstract: Surface plasmon resonance method for probing interactions in nanostructures: CdS nanoparticles linked to Au and Ag substrates by self-assembled hexanedithiol and aminoethanethiol monolayers

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Cited by 28 publications
(15 citation statements)
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“…(˛hv) = A * (hv − E g ) 1/2 (7) where E g is the optical band gap of thin films and A * is a constant having the numerical values of 2 × 10 4 cm −1 (eV) −1/2 whenį s expressed in cm −1 , h and E g are in electron volt (eV). An energy gap of 2.42 eV is obtained by extrapolating the linear part of the (˛h ) 2 vs (h ), as typically shown in the inset of Fig.…”
Section: T (K)mentioning
confidence: 99%
See 1 more Smart Citation
“…(˛hv) = A * (hv − E g ) 1/2 (7) where E g is the optical band gap of thin films and A * is a constant having the numerical values of 2 × 10 4 cm −1 (eV) −1/2 whenį s expressed in cm −1 , h and E g are in electron volt (eV). An energy gap of 2.42 eV is obtained by extrapolating the linear part of the (˛h ) 2 vs (h ), as typically shown in the inset of Fig.…”
Section: T (K)mentioning
confidence: 99%
“…caused by deviation of CdS composition from the stoichiometry. Recently, semiconductor nanostructures have gained considerable importance because of their unusual optical, electrical and device applications [7][8][9][10][11].…”
Section: Introductionmentioning
confidence: 99%
“…5 23,38,39 The smaller barrier height of the as-deposited sample is attributed to the presence of a second phase, possibly CdO, 31 at the Au/CdS interface. This phase forms an insulating layer that accommodates part of the work function difference between CdS and Au.…”
Section: A Cmentioning
confidence: 99%
“…The nonideality factor is 2.2 6 0.1, which is in good accordance with values of Schottky diodes made from nanocrystalline CdS films. 39,43,44 The series resistance obtained from the fit is 149 6 18 X, which represents the sum of the bulk CdS resistance and the contact resistance of the TiN/CdS contact. Because the distance between the Au contact and the TiN back contact is only a few hundred nanometers, the magnitude of the bulk resistance is negligible.…”
Section: A Cmentioning
confidence: 99%
“…Thus, efforts have been made to study the properties of the interfaces through the measurements of I -V characteristics in Au-CdS junction by Chavez et al [12] and by Patel et al [14]. Also, electrical studies have been made by Gupta et al [15] for Cu-CdS and Zn-CdS Schottky junctions by determining various junction parameters.…”
Section: Introductionmentioning
confidence: 98%