2012
DOI: 10.1016/j.solmat.2011.11.032
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Interface modification of a highly air-stable polymer solar cell

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Cited by 41 publications
(11 citation statements)
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“…PFDCTBT-C8 [81] Dark poly(fl uorenedicyclopentathiophene-altbenzothiadiazole) with octyl side chains a-PTPTBT [82] Dark Poly(thiophene-phenylene-thiophene -2,1,3-benzothia-diazole) [80][81][82][86][87][88][89][90][91][92][93][94][95] and under light (right). [ 73,78,[83][84][85] PCE represents the values at the point of stabilization of the aging curve ( E s value).…”
Section: Namementioning
confidence: 99%
“…PFDCTBT-C8 [81] Dark poly(fl uorenedicyclopentathiophene-altbenzothiadiazole) with octyl side chains a-PTPTBT [82] Dark Poly(thiophene-phenylene-thiophene -2,1,3-benzothia-diazole) [80][81][82][86][87][88][89][90][91][92][93][94][95] and under light (right). [ 73,78,[83][84][85] PCE represents the values at the point of stabilization of the aging curve ( E s value).…”
Section: Namementioning
confidence: 99%
“…For instance, in P3HT oxygen has been demonstrated to react with the side chain by insertion in the alpha position relative to the thiophene ring [12].In polyfluorenes oxygen insertion next to the quaternary carbon leads to fluorenone units and results in severe damage of the polymer properties [13]. Blocking of similar carbon positions with bulky side chains that prevent oxygen insertion has resulted in important increases in device stability [14], especially when aryl groups are used instead of alkyl chains. Large improvements in the stability of organic devices can be obtained in inverted configurations that bypass the need to use PEDOT:PSS.…”
Section: Introductionmentioning
confidence: 99%
“…Within the development of polymer solar cells that seek for stability and lifetime, an inverted structure with reverse electron flow has shown its significance recently [4][5][6][7][8][9][10][11][12][13][14]. In conventional structures, poly (3,4-ethylenedioxythiophene):poly(styrenesulfonate) (PEDOT:PPS), a conductive polymer, which is frequently deposited as the hole transport layer (HTL), is found to cause corrosion to ITO.…”
Section: Introductionmentioning
confidence: 99%