1996
DOI: 10.1080/00150193.1996.10399421
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Interface Plasmon Polariton and X-Ray Reflectivity of Ultrathin Films of Ferroelectric Main-Chain Liquid Crystal Polymers

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Cited by 2 publications
(2 citation statements)
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“…The angle for minimum reflectivity is shifted by Δθ = 0.12°. While the points shown in Figure (curves a and b) correspond to the experimental data, the solid lines appearing in the curves corresponds to the Fresnel numerical fits . From these fits we estimate that the index of refraction of the monolayer is n = 1.53 and its thickness is 11.0 Å.…”
Section: Resultsmentioning
confidence: 85%
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“…The angle for minimum reflectivity is shifted by Δθ = 0.12°. While the points shown in Figure (curves a and b) correspond to the experimental data, the solid lines appearing in the curves corresponds to the Fresnel numerical fits . From these fits we estimate that the index of refraction of the monolayer is n = 1.53 and its thickness is 11.0 Å.…”
Section: Resultsmentioning
confidence: 85%
“…Thus, any perturbation in the dielectric properties of the metal−solution interface, i.e., as a result of the adsorption or binding of chemicals on the metal support, is expected to alter the SPR conditions. Indeed, SPR has been extensively used to characterize the formation of monolayers or thin films on metal supports. The binding of proteins and other biomaterials on metal surfaces was examined by SPR …”
mentioning
confidence: 99%