“…X-ray reflectometry possesses a sub-nanometre depth resolution for electronic density shaping (Segmü ller, 1973;Liu et al, 2013;Macke et al, 2014) and this technique, complemented with resonant scattering near absorption edges or with nuclear resonant excitation, opens a way for detailed characterization of magnetization depth profiles (see e.g. Ishimatsu et al, 1999;Jaouen et al, 2004;Gibert et al, 2016;Diederich et al, 2007;Schlage et al, 2009;Andreeva et al, 2015Andreeva et al, , 2018Khanderao et al, 2020).…”