Interface roughness and texture in Co/Cu multilayers with Ti buffer layer

Atomic separation in Co/Cu/Co magnetic structures study by hybrid X-ray reflectivity – X-ray standing wave approach

“…Reflectivity, arb.unit. Depth, nm close optical constant values is typical for an XRR study of Co/Cu systems [17,18]. Marszalek et al [19] reported that periodic multilayered Co/Cu structures grown by thermal sputtering are characterized by a strong smearing of interfaces at a level of 3 nm, which could additionally intricate studying of barriers in Co/Cu structures.…”