2020
DOI: 10.1016/j.matdes.2020.108802
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Interfacial adhesion of alumina thin films over the full compositional range of ternary fcc alloy films: A combinatorial nanoindentation study

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Cited by 16 publications
(6 citation statements)
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“…A detailed description of the shutter system can be found in Ref. [6]. A combination of W, Cr, and Ta was used to create (3 × 3) matrices of single element and binary alloy adhesion layers with different compositions on single 2" passivated Si wafers, schematically shown in Figure 1a.…”
Section: Methodsmentioning
confidence: 99%
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“…A detailed description of the shutter system can be found in Ref. [6]. A combination of W, Cr, and Ta was used to create (3 × 3) matrices of single element and binary alloy adhesion layers with different compositions on single 2" passivated Si wafers, schematically shown in Figure 1a.…”
Section: Methodsmentioning
confidence: 99%
“…Ideally, material discovery and design efforts involve close coupling between materials prediction, synthesis, and characterization [2]. Combinatorial thin film science is one optimization method for material properties, whether they be mechanical, functional, or interfacial, using significantly fewer resources than a traditional bulk analysis technique and conducted in substantially less time [4][5][6]. The method combines high-throughput synthesis and subsequent characterization of multinary material libraries on a single wafer, allowing for screening of unique properties or the optimization of specific properties for a desired application.…”
Section: Introductionmentioning
confidence: 99%
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