2019
DOI: 10.1088/1361-6463/aafd88
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Interfacial evolution of AgBiS2 absorber layer obtained by SILAR method in hybrid solar cells

Abstract: AgBiS 2 is a promising and environmentally friendly absorber material for use in hybrid solar cells (HSC). Here, we report a study on the evolution of interfacial phenomena observed during deposition of AgBiS 2 onto mesoporous TiO 2 by the twostage successive ionic layer adsorptionreaction method. With this approach, inorganic-organic HSC were assembled using Co 2+ doped P3HT as hole transport layer. Surface photovoltage spectroscopy and contact potential difference measurements corroborated a low density of t… Show more

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Cited by 22 publications
(13 citation statements)
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“…Solar performance of the present result is compared with previous reports and is given in table 6. From the table 6, it is noted that the device FTO/ AgBiS 2 /CdS/Ag has higher e ciency than that of AgBiS 2 /PTB7 [56], AgBiS 2 QDSSC [9], ITO/ZnO/AgBiS 2 /P3HT/MoO 3 /Al [17] devices whereas slightly lower than ITO/ZnO/AgBiS 2 /P3HT/Au [37] and ITO/ZnO/ AgBiS 2 /PTB7/MoO 3 /Ag [11,12] devices. By comparing with higher performance devices, the present study used AgBiS 2 coated on FTO as 'p' layer, CdS as 'n' layer and Ag metallic contact whereas in the previous investigations, the authors had used polymer layer for conducting enhancement, window layer for avoiding the loss of incident photons and Mo as metallic contact.…”
Section: Resultsmentioning
confidence: 99%
“…Solar performance of the present result is compared with previous reports and is given in table 6. From the table 6, it is noted that the device FTO/ AgBiS 2 /CdS/Ag has higher e ciency than that of AgBiS 2 /PTB7 [56], AgBiS 2 QDSSC [9], ITO/ZnO/AgBiS 2 /P3HT/MoO 3 /Al [17] devices whereas slightly lower than ITO/ZnO/AgBiS 2 /P3HT/Au [37] and ITO/ZnO/ AgBiS 2 /PTB7/MoO 3 /Ag [11,12] devices. By comparing with higher performance devices, the present study used AgBiS 2 coated on FTO as 'p' layer, CdS as 'n' layer and Ag metallic contact whereas in the previous investigations, the authors had used polymer layer for conducting enhancement, window layer for avoiding the loss of incident photons and Mo as metallic contact.…”
Section: Resultsmentioning
confidence: 99%
“…7 These trap states adversely influence the charge carrier dynamics and affect the current and voltage of the device. The generally observed lower V oc found in these AgBiS 2 devices mainly arises from these trap assisted recombination losses 42 and recombinations from mismatches of the bandgap energy alignment of the interface layers, which will be discussed in the sections ahead.…”
Section: Device Architecture and Passivation Strategiesmentioning
confidence: 91%
“…improved the PCE to 2.87% (ref. 42) with reduced trap states, opening scope for further research in this area.…”
Section: Device Architecture and Passivation Strategiesmentioning
confidence: 99%
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“…However, AgBiS 2 NCs can grow in situ directly on the electron transport layer (ETL) through the SILAR method, avoiding the problems of insufficient ligand exchange and solvent residue during the spin coating process effectively, thus reducing the interface defects. 51 For the first time in 2013, Huang et al 44 reported AgBiS 2 absorber prepared by SILAR and 0.5% PCE for the device. Subsequently, Yanez et al 51 improved PCE to 2.87%.…”
Section: New Atfscs: Materials and Devicesmentioning
confidence: 99%