52nd Electronic Components and Technology Conference 2002. (Cat. No.02CH37345)
DOI: 10.1109/ectc.2002.1008327
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Interfacial fracture toughness test methodology for flip chip underfill encapsulant

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Cited by 3 publications
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“…The failure modes depending on the type of load applied to the crack and the in the solder joints can be adhesive (interface failures between stress fields surrounding the crack tip. solder and metallization) or cohesive (failure through the Frtefatr ehnc prah adihts solder joint) in nature [1,2]. Bulk solders have been used for .…”
mentioning
confidence: 99%
“…The failure modes depending on the type of load applied to the crack and the in the solder joints can be adhesive (interface failures between stress fields surrounding the crack tip. solder and metallization) or cohesive (failure through the Frtefatr ehnc prah adihts solder joint) in nature [1,2]. Bulk solders have been used for .…”
mentioning
confidence: 99%