Interfacial modification between NiO_x and perovskite layers with hexafluorophosphate salts for enhancing device efficiency and stability of perovskite solar cells

Abstract

Inorganic metal oxides like nickel oxide (NiOx) have been largely adopted as the hole transport (HTL) for the fabrication of perovskite solar cells (PSCs). Reducing interfacial defects between the NiOx...

Exploration and Optimization of the Polymer-Modified NiOx Hole Transport Layer for Fabricating Inverted Perovskite Solar Cells

“…The corresponding XRD patterns and top-view SEM images of perovskite layers are provided in Figures S3 and S4. Several intense diffraction peaks at 2θ = 13.95°, 19.86°, 24.58°, 28.33°, 31.82°, 34.91°, 40.51°, and 43.12° were found, corresponding to the (001), (011), (111), (002), (012), (112), (022), and (003) planes of the perovskite, respectively, which are consistent with the previous literature [47][48][49]. Furthermore, the perovskite grains on the o-NiOx, p-NiOx and p-NiOx/o-NiOx films appear similar in Figure S4.…”

“…It is evident that the PSC using p-NiO x has a larger leakage current than that using o-NiO x as the HTL. While the PSC based on p-NiO x /NiO x possesses the lowest dark current, it conveys benefits for reducing recombination loss and enhancing carrier transport [ 48 , 55 ]. According to the previous literature [ 56 , 57 ], the values of the series resistance ( R s ) and shunt resistance ( R sh ) of PSCs can be determined from the voltage dependence of the differential resistance ( R diff ) using the equation R diff = Δ V/ Δ J , as displayed in Figure S8 .…”