Interfacial Oxygen Vacancy of CuO_x‐CeO₂ Enhances H₂O₂ Activation and Pollutant Degradation

Abstract

In the Fenton process, the development of catalysts with a wide pH range and good stability has been a long‐term goal in water treatment technology. This study proposes a strategy to solve this problem by preparing supported catalysts CuOx@CeO2‐IE using an ion exchange reversed loading method. The generation of a large number of interfacial oxygen vacancies with Cu‐OV‐Ce (OV represents an oxygen vacancy site) structures prolongs the O‐O bond of H2O2, promotes the rupture of the peroxide bond of H2O2, and thereby promotes the activation of H2O2 on the surface of the catalyst. The results show that with a H2O2 concentration of 5 mM and CuOx@CeO2‐IE at 50 mg/L, the removal rate of bisphenol A is 94.1% in 60 min, in which •OH dominates the degradation process. Moreover, the system can operate well within a relatively wide pH range (4‐8). This study provides a novel strategy for the design of Fenton catalysts with a wide pH suitability and excellent stability.