Interference and diffraction with partially coherent light

Born, Max; Wolf, Emil; Bhatia, A. B.; Clemmow, P. C.; Gábor, D.; Stokes, Adam; Taylor, A. M.; Wayman, P. A.; Wilcock, W. L.

doi:10.1017/cbo9781139644181.019

Cited by 25 publications

(20 citation statements)

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“…where R d is the spatial resolution, λ is the wavelength of the imaging beam, and α max is the aperture angle of the lens [59]. In electron microscopy, the wavelength is determined by the de Broglie relation for electrons λ = h/p, where h is Planck's constant and p is the electron momentum.…”

Section: Aberration Correction 1 Electron Optics and Image Resolutionmentioning

confidence: 99%

Aberration Corrected Photoemission Electron Microscopy with Photonics Applications

Fitzgerald¹

2000

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Photoemission electron microscopy (PEEM) uses photoelectrons excited from material surfaces by incident photons to probe the interaction of light with surfaces with nanometer-scale resolution. The point resolution of PEEM images is strongly limited by spherical and chromatic aberration. Image aberrations primarily originate from the acceleration of photoelectrons and imaging with the objective lens and vary strongly in magnitude with specimen emission characteristics. Spherical and chromatic aberration can be corrected with an electrostatic mirror, and here I develop a triode mirror with hyperbolic geometry that has two adjacent, field-adjustable regions. I present analytic and numerical models of the mirror and show that the optical properties agree to within a few percent. When this mirror is coupled with an electron lens, it can provide a large dynamic range of correction and the coefficients of spherical and chromatic aberration can be varied independently. I report on efforts to realize a triode mirror corrector, including design, characterization, and alignment in our microscope at Portland State University (PSU). PEEM may be used to investigate optically active nanostructures, and we show that photoelectron emission yields can be identified with diffraction, surface plasmons, and dielectric waveguiding.Furthermore, we find that photoelectron micrographs of nanostructured metal and dielectric structures correlate with electromagnetic field calculations. We conclude that photoemission is highly spatially sensitive to the electromagnetic field intensity, allowing the direct visualization of the interaction of light with material surfaces at nanometer scales and over a wide range of incident light frequencies.ii

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Section: Aberration Correction 1 Electron Optics and Image Resolutionmentioning

confidence: 99%

Aberration Corrected Photoemission Electron Microscopy with Photonics Applications

Fitzgerald¹

2000

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“…If we assume that the light entering the optical setup is a combination of linearly polarized light and completely depolarized light, as would be the case if the polarization of the transmitted light is linear and the depolarizing scatterers do not have a preferred orientation [8]- [10], the Stokes vector describing the intensity and polarization state for that radiation will be [11]   || || cos 2 sin 2 0…”

Section: Proposed Setupmentioning

confidence: 99%

Concept Design of a Multiwavelength Aerosol Lidar System With Mitigated Diattenuation Effects and Depolarization-Measurement Capability

Comerón

Sicard

Vidal

et al. 2016

EPJ Web of Conferences

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It is known that the retrieval of aerosol extinction and backscatter coefficients from lidar data acquired through so-called total-power channelsintended to measure the backscattered power irrespective of the polarization -can be adversely affected by varying depolarization effects produced by the aerosol under measurement. This effect can be particularly noticeable in advanced multiwavelength systems, where different wavelengths are separated using a system of dichroic beam splitters, because in general the reflection and transmission coefficients of the beam splitters will be different for fields with polarization parallel or perpendicular to the incidence plane. Here we propose a setup for multiwavelength aerosol lidars alleviating diattenuation effects due to changing depolarization conditions while allowing measure linear depolarization.

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“…linear, homogeneous and isotropic [30][31][32]. The transverse nature of light waves mean that the electric and magnetic fields oscillates orthogonally to the direction of their propagation.…”

Section: Light As Electromagnetic Radiationmentioning

confidence: 99%

Time-domain ptychography

et al. 2015

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Through dedicated measurements in the optical regime we demonstrate that ptychography can be applied to reconstruct complex-valued object functions that vary with time from a sequence of spectral measurements. A probe pulse of approximately 1 ps duration, time delayed in increments of 0.25 ps is shown to recover dynamics on a ten times faster time scale with an experimental limit of approximately 5 fs.

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Interference and diffraction with partially coherent light

Cited by 25 publications

References 0 publications

Aberration Corrected Photoemission Electron Microscopy with Photonics Applications

Aberration Corrected Photoemission Electron Microscopy with Photonics Applications

Concept Design of a Multiwavelength Aerosol Lidar System With Mitigated Diattenuation Effects and Depolarization-Measurement Capability

Time-domain ptychography

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