2016
DOI: 10.1117/1.oe.55.7.074110
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Interference microscope objectives for wide-field areal surface topography measurements

Abstract: Abstract. We propose a type of interference objective that extends the range of application for flexible microscope platforms to larger fields of view. The objective comprises a beamsplitter plate and a partially transparent reference mirror arranged coaxially with the objective lens system. The coaxial plates are slightly tilted to direct unwanted reflections outside of the imaging pupil aperture, providing high fringe contrast with spatially extended white-light illumination. Examples include a turret-mounta… Show more

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Cited by 18 publications
(9 citation statements)
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“…The instrument is located in a facility with a controlled temperature of ð20 AE 1Þ°C, isolated from noise and dust. Four different objective lenses, with magnifications of 1.4×, 28 5.5×, 20×, and 50×, were investigated and combined with 0.5× and 1× zoom lenses. The specifications of the objective lenses are shown in Table 1.…”
Section: Instrumentmentioning
confidence: 99%
“…The instrument is located in a facility with a controlled temperature of ð20 AE 1Þ°C, isolated from noise and dust. Four different objective lenses, with magnifications of 1.4×, 28 5.5×, 20×, and 50×, were investigated and combined with 0.5× and 1× zoom lenses. The specifications of the objective lenses are shown in Table 1.…”
Section: Instrumentmentioning
confidence: 99%
“…Various interferometry configurations are in use for OCT but the main configuration remains the Michelson interferometer [10]. In a Michelson interferometer objective, suitable for small magnifications, a beam splitter cube and a reference mirror are inserted between the objective and the sample [11]. Michelson interferometer requires a long working-distance objective because at magnifications higher then 50X, the working distance becomes too short to squeeze in a beam splitter cube.…”
Section: Introductionmentioning
confidence: 99%
“…The point-to-point sampling data in profilers [4,5] needs to be spliced to obtain the full-aperture surface; besides, the measurement with the profiler is inefficient, time-consuming and can be easily affected by scanning mechanism precision and environmental disturbance. The interference microscope [6][7][8][9] has been serving as an accurate, highly efficient way for the roughness measurement. However, its dynamic range is quite limited, making it not suitable for the testing of surfaces with large slopes.…”
Section: Introductionmentioning
confidence: 99%