2008
DOI: 10.1117/12.768410
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Interferometric characterization of MOEMS devices in cryogenic environment for astronomical instrumentation

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Cited by 13 publications
(6 citation statements)
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“…It has the ability to use a compact cryo-vacuum chamber designed for reaching 10-6 mbar and 160K, in front of our custom interferometer. This set-up is able to measure performance of a deformable mirror at actuator/segment level and at the entire mirror level, with a lateral resolution of 2µm and a sub-nanometer z-resolution [28]. PSI allows the shape of the segmented surface to be restored with very fine spatial resolution, thus showing the internal deformation within the segments.…”
Section: Phase Shifting Interferometry (Psi)mentioning
confidence: 99%
“…It has the ability to use a compact cryo-vacuum chamber designed for reaching 10-6 mbar and 160K, in front of our custom interferometer. This set-up is able to measure performance of a deformable mirror at actuator/segment level and at the entire mirror level, with a lateral resolution of 2µm and a sub-nanometer z-resolution [28]. PSI allows the shape of the segmented surface to be restored with very fine spatial resolution, thus showing the internal deformation within the segments.…”
Section: Phase Shifting Interferometry (Psi)mentioning
confidence: 99%
“…As we are using low coherence interferometry, the fringe contrast can be kept at maximum by balancing the optical path in the reference arm of the interferometer with a compensation plate identical to the chamber window. In our set-up, the chamber window and the compensation plate have been manufactured at the same time in the same glass material [ 13 ].…”
Section: Cryogenic Interferometric Test Set-upmentioning
confidence: 99%
“…The micromirrors could be successfully actuated before, during and after cryogenic cooling at 92K (Fig. 4) [7]. We could measure the surface quality of the gold coated micromirrors at room temperature, below 100K and being actuated: there is a slight increase of the deformation from 35 nm to 50nm PtV, due to CTE mismatch between silicon and gold layer (Fig.…”
Section: Programmable Slit Masksmentioning
confidence: 99%