Interferometry

Françon, M.

doi:10.1016/b978-0-12-264850-2.50013-x

Cited by 24 publications

(29 citation statements)

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“…In holography, complete information on the spatial light distribution is obtained by recording the fringes resulting from the interference with a reference field. Likewise, the complex shape of a pulse under test (PUT) can be extracted by interfering it with a well-characterized reference pulse [4,12]. Spectral shearing interferometry uses a frequency detuned (sheared) replica of itself as a reference [4,7,13].…”

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Sub-picosecond phase-sensitive optical pulse characterization on a chip

et al. 2011

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confidence: 99%

“…Interferometry is broadly used in optics to measure the phase and amplitude of the electric field [4,12]. In holography, complete information on the spatial light distribution is obtained by recording the fringes resulting from the interference with a reference field.…”

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Sub-picosecond phase-sensitive optical pulse characterization on a chip

et al. 2011

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“…At EUV and SXR wavelengths, wavefront division interferometers are employed as effective beam splitters are not available due to the near unity value of the index of refraction. [72][73][74] This chapter presents an interferometric experiment designed to measure index of refraction. First, index of refraction is defined and previous methods used to determine index of refraction are reviewed.…”

Section: Beamline Challengesmentioning

confidence: 99%

Tunable coherent radiation at soft X-ray wavelengths: Generation and interferometric applications

Rosfjord

2004

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The availability of high power, spectrally and spatially coherent soft x-rays (SXR) would facilitate a wide variety of experiments as this energy region covers the primary resonances of many magnetic and biological materials. Specifically, there are the carbon and oxygen K-edges that are critical for biological imaging in the water window and the L-edges of iron, nickel, and cobalt for which imaging and scattering studies can be performed.A new coherent soft X-ray branchline at the Advanced Light Source has begun operation (beamline 12.0.2). Using the third harmonic from an 8 cm period undulator, this branch delivers coherent soft x-rays with photon energies ranging from 200eV to 1keV. This branchline is composed of two sub-branches one at 14X demagnification and the other 8X demagnification. The former is optimized for use at 500eV and the latter at 800eV. Here the expected power from the third harmonic of this undulator and the beamline design and characterization is presented. The characterization includes measurements on available photon flux as well as a series of double pinhole experiments to determine the coherence factor with respect to transverse distance. The first high quality Airy patterns at SXR wavelengths are created with this new beamline.The operation of this new beamline allows for interferometry to be performed in the SXR region. Here an interferometric experiment designed to directly determine the index of refraction of a material under test is performed.Measurements are first made in the EUV region using an established beamline (beamline12.0.1) to measure silicon, ruthenium and tantalum silicon nitride. This work is then extended to the SXR region using beamline 12.0.2 to test chromium and vanadium.

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“…Contact type methods using a probe have limitations in measuring small features due to the size of the probe tip. Thus, non-contact technologies such as confocal microscopy [2,3], fringe projection, interferometry [4], wavefront sensing [5], and holography [6,7] are preferred in measuring features of the micro-lens array. Although confocal microscopy is useful in micro-optics characterization, it requires a time-consuming point scanning in order to make 3D measurements [3].…”

Section: Introductionmentioning

confidence: 99%

Unambiguous 3D Surface Measurement Method for a Micro-Fresnel Lens-Shaped Lenticular Lens Based on a Transmissive Interferometer

Yoon¹,

Kim²,

Kim³

et al. 2014

Journal of the Optical Society of Korea

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The use of a laser interferometer as a metrological tool in micro-optics measurement is demonstrated. A transmissive interferometer is effective in measuring an optical specimen having a high angle slope. A configuration that consists of an optical resolution of 0.62 micron is adapted to measure a specimen, which is a micro-Fresnel lens-shaped lenticular lens. The measurement result shows a good repeatability at each fraction of facets, however, a reconstruction of the lens shape profile is disturbed by a known problem of 2π-ambiguity. To solve this 2π-ambiguity problem, we propose a two-step phase unwrapping method. In the first step, an unwrapped phase map is obtained by using a conventional unwrapping method. Then, a proposed unwrapping method based on the shape modeling is applied to correct the wrongly unwrapped phase. A measured height of each facet is compared with a profile result measured by AFM.

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Interferometry

Cited by 24 publications

References 0 publications

Sub-picosecond phase-sensitive optical pulse characterization on a chip

Sub-picosecond phase-sensitive optical pulse characterization on a chip

Tunable coherent radiation at soft X-ray wavelengths: Generation and interferometric applications

Unambiguous 3D Surface Measurement Method for a Micro-Fresnel Lens-Shaped Lenticular Lens Based on a Transmissive Interferometer

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