Interlaboratory Investigation of On-wafer S-parameter Measurements from 110 GHz to 1.1 THz

Shang, Xiaobang; Ridler, Nick; Arz, Uwe; Phung, Gia Ngoc; Roch-Jeune, Isabelle; Ducournau, Guillaume; Haddadi, Kamel; Flisgen, Thomas; Doerner, Ralf; Allal, Djamel; Jayasankar, Divya; Stake, Jan; Schmidt, Robin; Fisher, Gavin; Mubarak, Faisal

doi:10.23919/eumc58039.2023.10290550

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Interlaboratory Investigation of On-wafer S-parameter Measurements from 110 GHz to 1.1 THz

Cited by 2 publications

References 17 publications

On-Wafer Capacitor Characterization Including Uncertainty Estimates Up to 1.0 THz

On-Wafer Capacitor Characterization Including Uncertainty Estimates Up to 1.0 THz

A 0.1 GHz to 1.1 THz Inverted Grounded-CPW mTRL Calibration Kit Characterization in an InP HBT Process

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