2008
DOI: 10.1063/1.2919151
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Interlevel transitions and two-photon processes in Ge/Si quantum dot photocurrent

Abstract: Photocurrent spectra due to interlevel transitions of holes in Ge/Si quantum dots show several peaks in the range of 60–300 meV, which superlinearly increase with bias, indicating release of carriers by tunneling. The relative peak intensity drastically changes with applied voltage, its polarity, and the measurement system. Lower energy peaks, at 69 and 86 meV, are observed only with a Fourier transform IR (FTIR) spectrometer. The 69 and 86 meV transitions excite holes into intermediate levels from which they … Show more

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Cited by 23 publications
(12 citation statements)
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“…The built-in voltage was found to be U 0 =0.68 and 0.94 V for U b <0 and U b >0, respectively. These values are typical for p-type Ge/Si QDIPs [9]. …”
Section: Resultsmentioning
confidence: 94%
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“…The built-in voltage was found to be U 0 =0.68 and 0.94 V for U b <0 and U b >0, respectively. These values are typical for p-type Ge/Si QDIPs [9]. …”
Section: Resultsmentioning
confidence: 94%
“…Ge/SiGe QDIP is of wide detection window with the cutoff wavelength of about 12 μ m instead of 5 to 6 μ m for Ge/Si QDIPs of similar device structure [11]. Since the sample in FTIR experiments is simultaneously exposed to a wide range of photon energies, the spectra may display additional transitions due to two-photon processes [9]. The near-infrared photons with energies larger than the SiGe bandgap create electrons and holes mostly in the SiGe barrier.…”
Section: Resultsmentioning
confidence: 99%
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“…Here and below, the positive photocur rent values correspond to the situation where holes move from the upper electric contact to the substrate. The photoresponse observed in the mid IR range is associated with the transitions of holes from the states coupled in quantum dots to the continuous spectrum [2,4,6,9]. The photocurrent in the sample with N B = 2 × 10 11 cm -2 at zero bias is negative (Fig.…”
Section: Bidirectional Photocurrent Of Holes In Layers Of Ge/si Quantmentioning
confidence: 92%