Interplay between chemical and magnetic roughness of Pt in a Pt/Co bilayer investigated with X-ray resonant magnetic reflectometry

Geissler, J.; Goering, E.; Weigand, F.; Schütz, Gisela

doi:10.3139/146.020946

Cited by 7 publications

(7 citation statements)

References 45 publications

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“…This procedure has been done by many groups so far. To find some more examples please see [18,35,86].…”

Section: Retrieving the Optical Constantsmentioning

confidence: 99%

“…If ever a small additional fraction, related to Pt, is observed one cannot distinguish this additional part from an interface induced enhanced magnetism moment in the TM. Therefore, XRMR is an ideal tool to study in an element-specific manner the magnetization of Pt, which has been performed at the Pt L 3 edge [18,86]. Figure 11 shows our results performed at different bilayers of Pt/Co where, due to various buffer layers and preparation procedures, the roughness of the CoPt interface has been varied systematically [86].…”

Section: Hard X-ray Reflectivity For Single Layer Systems: Induced Mamentioning

confidence: 99%

“…Therefore, XRMR is an ideal tool to study in an element-specific manner the magnetization of Pt, which has been performed at the Pt L 3 edge [18,86]. Figure 11 shows our results performed at different bilayers of Pt/Co where, due to various buffer layers and preparation procedures, the roughness of the CoPt interface has been varied systematically [86]. Figure 11(a) shows the NM and nonresonant reflection profiles, measured with a Cu anode.…”

Section: Hard X-ray Reflectivity For Single Layer Systems: Induced Mamentioning

confidence: 99%

Section: Hard X-ray Reflectivity For Multilayer Systems: Cefementioning

confidence: 99%

“…Figure 11 shows our results performed at different bilayers of Pt/Co where, due to various buffer layers and preparation procedures, the roughness of the CoPt interface has been varied systematically [86]. Figure 11(a) shows the NM and nonresonant reflection profiles, measured with a Cu anode.…”

Section: Hard X-ray Reflectivity For Multilayer Systems: Cefementioning

confidence: 99%

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Magnetic reflectometry of heterostructures

Macke

Goering

2014

J. Phys.: Condens. Matter

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Measuring the magnetic configuration at complex buried layers and interfaces is an important task, which requires especially a non-destructive probing technique. X-ray resonant magnetic reflectometry (XRMR) combines the non-destructive depth profiling potential of x-ray reflectometry with the excellent sensitivity for magnetic phenomena, utilizing the x-ray magnetic circular dichroism effect. It provides the magnetic spatial distribution with a precision down to the angstrom scale, combined with element and symmetry specificity, sub-monolayer sensitivity, and the possible separation of spin and orbital magnetic moments. This review provides an overview to the XRMR technique in a tutorial way. We focus on the introduction to the theory, measurement types, and data simulation. We provide related experimental examples and show selected applications.

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“…This procedure has been done by many groups so far. To find some more examples please see [18,35,86].…”

Section: Retrieving the Optical Constantsmentioning

confidence: 99%

Section: Hard X-ray Reflectivity For Single Layer Systems: Induced Mamentioning

confidence: 99%

Section: Hard X-ray Reflectivity For Single Layer Systems: Induced Mamentioning

confidence: 99%

Section: Hard X-ray Reflectivity For Multilayer Systems: Cefementioning

confidence: 99%

Section: Hard X-ray Reflectivity For Multilayer Systems: Cefementioning

confidence: 99%

See 3 more Smart Citations

Magnetic reflectometry of heterostructures

Macke

Goering

2014

J. Phys.: Condens. Matter

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Synchrotron Radiation Techniques Based onX‐rayMagnetic Circular Dichroism

Schütz

Goering

Stoll

2007

Handbook of Magnetism and Advanced Magnetic Materials

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X‐ray magnetic circular dichroism (XMCD) results from the dependence of the absorption cross section on the magnetization of the target. The use of highly intense, circular‐polarized synchrotron X‐ray sources close to an absorption edge energy allows an element‐specific and quantitative determination of local magnetic spin and orbital moments. If the energy is tuned to the circular dichroic active absorption edges, most of the X‐ray spectroscopic scattering and imaging techniques can be extended to their magnetic counterpart, which provides new insights into magnetic, electronic, and geometric structures and phenomena.

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